Kazuyuki HINO

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Yokohama Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Stress analysis method and semiconductor device manufacturing method
- Patent number 11,901,223
- Issue date Feb 13, 2024
- Kioxia Corporation
- Hiroshi Yoshimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask pattern correction system, and semiconductor device manufactur...
- Patent number 10,852,648
- Issue date Dec 1, 2020
- TOSHIBA MEMORY CORPORATION
- Kazuyuki Hino
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
STRESS ANALYSIS METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20210296166
- Publication date Sep 23, 2021
- Kioxia Corporation
- Hiroshi YOSHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK PATTERN CORRECTION SYSTEM, AND SEMICONDUCTOR DEVICE MANUFACTUR...
- Publication number 20200117104
- Publication date Apr 16, 2020
- Toshiba Memory Corporation
- Kazuyuki HINO
- G06 - COMPUTING CALCULATING COUNTING