Kazuyuki HIRAO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for image adjustment and charged particle beam system
- Patent number 11,276,552
- Issue date Mar 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Tomizawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,276,550
- Issue date Mar 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Mari Takabatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image-forming device, and dimension measurement device
- Patent number 10,976,536
- Issue date Apr 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasunori Takasugi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image-forming device, and dimension measurement device
- Patent number 10,620,421
- Issue date Apr 14, 2020
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- G01 - MEASURING TESTING
Information Patent Grant
Overlay error measuring device and computer program for causing com...
- Patent number 10,545,017
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement apparatus and defect inspection apparatus
- Patent number 10,417,756
- Issue date Sep 17, 2019
- Hitachi High-Technologies Corporation
- Kei Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image-forming device, and dimension measurement device
- Patent number 10,197,783
- Issue date Feb 5, 2019
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- G02 - OPTICS
Information Patent Grant
Charged particle beam device
- Patent number 9,666,410
- Issue date May 30, 2017
- Hitachi High-Technologies Corporation
- Takefumi Kakinuma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device
- Publication number 20210241993
- Publication date Aug 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Mari TAKABATAKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Image Adjustment and Charged Particle Beam System
- Publication number 20210183611
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuki TOMIZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image-Forming Device, and Dimension Measurement Device
- Publication number 20200201019
- Publication date Jun 25, 2020
- Hitachi High-Technologies Corporation
- Yasunori TAKASUGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image-Forming Device, and Dimension Measurement Device
- Publication number 20190121113
- Publication date Apr 25, 2019
- Hitachi High-Technologies Corporation
- Yasunori TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Apparatus and Flaw Inspection Apparatus
- Publication number 20180012349
- Publication date Jan 11, 2018
- Hitachi High-Technologies Corporation
- Kei SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20160172154
- Publication date Jun 16, 2016
- Hitachi High-Technologies Corporation
- Takefumi KAKINUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COM...
- Publication number 20150285627
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Image-Forming Device, and Dimension Measurement Device
- Publication number 20150002652
- Publication date Jan 1, 2015
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- G02 - OPTICS

Kazuyuki HIRAO

Person

Patents Grantslast 30 patents

Method for image adjustment and charged particle beam system

Charged particle beam device

Image-forming device, and dimension measurement device

Image-forming device, and dimension measurement device

Overlay error measuring device and computer program for causing com...

Pattern measurement apparatus and defect inspection apparatus

Image-forming device, and dimension measurement device

Charged particle beam device

Patents Applicationslast 30 patents

Charged Particle Beam Device

Method for Image Adjustment and Charged Particle Beam System

Image-Forming Device, and Dimension Measurement Device

Image-Forming Device, and Dimension Measurement Device

Pattern Measurement Apparatus and Flaw Inspection Apparatus

Charged Particle Beam Device

OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COM...

Image-Forming Device, and Dimension Measurement Device