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Kazuyuki Maruo
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit switch matrix
Patent number
8,551,830
Issue date
Oct 8, 2013
Advantest Corporation
Tadahiro Ohmi
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Residue number system arithmetic operating system, scaling operator...
Patent number
8,326,908
Issue date
Dec 4, 2012
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit switch matrix
Patent number
7,667,276
Issue date
Feb 23, 2010
Advantest Corporation
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for detecting chemical substance
Patent number
7,265,369
Issue date
Sep 4, 2007
Advantest Corp.
Kazuyuki Maruo
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit
Patent number
7,193,434
Issue date
Mar 20, 2007
Advantest Corporation
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sum of product circuit and inclination detecting apparatus
Patent number
6,647,406
Issue date
Nov 11, 2003
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus and method for image processing
Patent number
6,584,236
Issue date
Jun 24, 2003
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Failure analyzing method and apparatus using two-dimensional wavele...
Patent number
6,442,733
Issue date
Aug 27, 2002
Advantest Corporation
Teruaki Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for detecting slope of image data utilizing hough-transform
Patent number
6,408,105
Issue date
Jun 18, 2002
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image information processing apparatus
Patent number
6,292,583
Issue date
Sep 18, 2001
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for recognition of image information
Patent number
6,259,809
Issue date
Jul 10, 2001
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of image processing
Patent number
6,163,619
Issue date
Dec 19, 2000
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Standard frequency and timing generator and generation method thereof
Patent number
6,081,163
Issue date
Jun 27, 2000
Advantest Corp.
Hitoshi Ujiie
G01 - MEASURING TESTING
Information
Patent Grant
Image processor having object recognition ability
Patent number
5,982,919
Issue date
Nov 9, 1999
Advantest Corp.
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of detecting particle-like point in an image
Patent number
5,963,661
Issue date
Oct 5, 1999
Advantest Corporation
Haruo Kato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing method for inspecting with analysis of binarized h...
Patent number
5,790,694
Issue date
Aug 4, 1998
Advantest Corporation
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor Integrated Circuit Switch Matrix
Publication number
20080318370
Publication date
Dec 25, 2008
Advantest Corporation
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Residue number system arithmetic operating system, scaling operator...
Publication number
20060184600
Publication date
Aug 17, 2006
Kazuyuki Maruo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit
Publication number
20060017071
Publication date
Jan 26, 2006
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor integrated circuit and manufacturing method of the same
Publication number
20060017101
Publication date
Jan 26, 2006
Tadahiro Ohmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Chemical substance detecting method and device
Publication number
20040197234
Publication date
Oct 7, 2004
Michiaki Endo
G01 - MEASURING TESTING
Information
Patent Application
Image matching method, image matching apparatus, and wafer processor
Publication number
20040146194
Publication date
Jul 29, 2004
Masayoshi Ichikawa
G06 - COMPUTING CALCULATING COUNTING