Kazuyuki MATSUSHITA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Detector
- Patent number 11,049,897
- Issue date Jun 29, 2021
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
Processing apparatus, method, and program
- Patent number 10,748,253
- Issue date Aug 18, 2020
- Rigaku Corporation
- Takuto Sakumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing apparatus, method of obtaining characteristic of ea...
- Patent number 10,551,510
- Issue date Feb 4, 2020
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
X-ray data processing apparatus and method and program for the same
- Patent number 10,222,491
- Issue date Mar 5, 2019
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray data processing apparatus, X-ray data processing method, and...
- Patent number 10,209,375
- Issue date Feb 19, 2019
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, and X-ray analysis apparatus and radiation dete...
- Patent number 9,945,961
- Issue date Apr 17, 2018
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-classifying type X-ray diffraction device
- Patent number 8,699,665
- Issue date Apr 15, 2014
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-classifying type X-ray diffraction device
- Patent number 8,300,767
- Issue date Oct 30, 2012
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTOR
- Publication number 20190245000
- Publication date Aug 8, 2019
- Rigaku Corporation
- TAKUTO SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, METHOD, AND PROGRAM
- Publication number 20190114746
- Publication date Apr 18, 2019
- Rigaku Corporation
- Takuto SAKUMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING APPARATUS, METHOD OF OBTAINING CHARACTERISTIC OF EA...
- Publication number 20180203132
- Publication date Jul 19, 2018
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...
- Publication number 20170371044
- Publication date Dec 28, 2017
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM FOR THE SAME
- Publication number 20160377749
- Publication date Dec 29, 2016
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...
- Publication number 20150212213
- Publication date Jul 30, 2015
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND...
- Publication number 20140236523
- Publication date Aug 21, 2014
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR AND X-RAY DIFFRACTION DEVICE
- Publication number 20140119512
- Publication date May 1, 2014
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRIP DETECTOR
- Publication number 20130062721
- Publication date Mar 14, 2013
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE
- Publication number 20120269322
- Publication date Oct 25, 2012
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE
- Publication number 20110317813
- Publication date Dec 29, 2011
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING

Kazuyuki MATSUSHITA

Person

Patents Grantslast 30 patents

Detector

Processing apparatus, method, and program

Data processing apparatus, method of obtaining characteristic of ea...

X-ray data processing apparatus and method and program for the same

X-ray data processing apparatus, X-ray data processing method, and...

Radiation detector, and X-ray analysis apparatus and radiation dete...

Wavelength-classifying type X-ray diffraction device

Wavelength-classifying type X-ray diffraction device

Patents Applicationslast 30 patents

DETECTOR

PROCESSING APPARATUS, METHOD, AND PROGRAM

DATA PROCESSING APPARATUS, METHOD OF OBTAINING CHARACTERISTIC OF EA...

RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...

X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM FOR THE SAME

RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...

X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND...

X-RAY DETECTOR AND X-RAY DIFFRACTION DEVICE

SEMICONDUCTOR STRIP DETECTOR

WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE

WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE