Kazuyuki Miyashita

Person

Chuo-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement method, exposure method and device manufacturing method
- Patent number 7,948,616
- Issue date May 24, 2011
- Nikon Corporation
- Kazuyuki Miyashita
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining exposure conditions, exposure method, device...
- Patent number 6,706,456
- Issue date Mar 16, 2004
- Nikon Corporation
- Kazuyuki Miyashita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...
- Publication number 20240036221
- Publication date Feb 1, 2024
- Nikon Corporation
- Fuminori HAYANO
- G01 - MEASURING TESTING
Information Patent Application
SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...
- Publication number 20190310385
- Publication date Oct 10, 2019
- Nikon Corporation
- Fuminori HAYANO
- G01 - MEASURING TESTING
Information Patent Application
LINEWIDTH MEASURING METHOD, IMAGE-FORMING-STATE DETECTING METHOD, A...
- Publication number 20090233195
- Publication date Sep 17, 2009
- Nikon Corporation
- Kazuyuki Miyashita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Measurement method, exposure method and device manufacturing method
- Publication number 20080259353
- Publication date Oct 23, 2008
- Nikon Corporation
- Kazuyuki Miyashita
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristics measurement method, exposure method and dev...
- Publication number 20080208499
- Publication date Aug 28, 2008
- Nikon Corporation
- Kazuyuki Miyashita
- G01 - MEASURING TESTING
Information Patent Application
Optical properties measurement method, exposure method, and device...
- Publication number 20040179190
- Publication date Sep 16, 2004
- Nikon Corporation
- Kazuyuki Miyashita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of determining exposure conditions, exposure method, device...
- Publication number 20030170552
- Publication date Sep 11, 2003
- Nikon Corporation
- Kazuyuki Miyashita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Kazuyuki Miyashita

Person

Patents Grantslast 30 patents

Measurement method, exposure method and device manufacturing method

Method of determining exposure conditions, exposure method, device...

Patents Applicationslast 30 patents

SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...

SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...

LINEWIDTH MEASURING METHOD, IMAGE-FORMING-STATE DETECTING METHOD, A...

Measurement method, exposure method and device manufacturing method

Optical characteristics measurement method, exposure method and dev...

Optical properties measurement method, exposure method, and device...

Method of determining exposure conditions, exposure method, device...