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Kazuyuki Ohmi
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Device for measuring temperature of semiconductor integrated circuit
Patent number
6,783,274
Issue date
Aug 31, 2004
Renesas Technology Corp.
Takehiko Umeyama
G01 - MEASURING TESTING
Information
Patent Grant
Non-volatile semiconductor memory device and manufacturing method t...
Patent number
6,452,226
Issue date
Sep 17, 2002
Mitsubishi Denki Kabushiki Kaisha
Kenji Kawai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having an improved contact structure and a man...
Patent number
6,346,482
Issue date
Feb 12, 2002
Mitsubishi Denki Kabushiki Kaisha
Junko Matsumoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
6,232,209
Issue date
May 15, 2001
Mitsubishi Denki Kabushiki Kaisha
Nobuo Fujiwara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-volatile semiconductor memory device and manufacturing method t...
Patent number
6,228,712
Issue date
May 8, 2001
Mitsubishi Denki Kabushiki Kaisha
Kenji Kawai
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DEVICE FOR MEASURING TEMPERATURE OF SEMICONDUCTOR INTEGRATED CIRCUIT
Publication number
20040081224
Publication date
Apr 29, 2004
Mitsubishi Denki Kabushiki Kaisha
Takehiko Umeyama
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING AN IMPROVED CONTACT STRUCTURE AND A MAN...
Publication number
20010041450
Publication date
Nov 15, 2001
JUNKO MATSUMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Non-volatile semiconductor memory device and manufacturing method t...
Publication number
20010019150
Publication date
Sep 6, 2001
Mitsubishi Denki Kabushiki Kaisha
Kenji Kawai
H01 - BASIC ELECTRIC ELEMENTS