Kazuyuki Yamashita

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device test apparatus and method of configuring electron...
- Patent number 7,919,974
- Issue date Apr 5, 2011
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device test apparatus for successively testing electroni...
- Patent number 7,800,393
- Issue date Sep 21, 2010
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device test apparatus for successively testing electroni...
- Patent number 7,612,575
- Issue date Nov 3, 2009
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device test apparatus
- Patent number 7,511,522
- Issue date Mar 31, 2009
- Advantest Corporation
- Akihiko Ito
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device tray electronic device tray, transporting apparat...
- Patent number 6,339,321
- Issue date Jan 15, 2002
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
IC transporting apparatus, IC posture altering apparatus and IC tak...
- Patent number 6,135,699
- Issue date Oct 24, 2000
- Advantest Corporation
- Watanabe Yutaka
- G01 - MEASURING TESTING
Information Patent Grant
IC transporting apparatus, IC posture altering apparatus and IC tak...
- Patent number 6,074,158
- Issue date Jun 13, 2000
- Advantest Corporation
- Watanabe Yutaka
- G01 - MEASURING TESTING
Information Patent Grant
Lead press mechanism for IC test handler
- Patent number 5,757,200
- Issue date May 26, 1998
- Advantest Corp.
- Kazuyuki Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE TEST APPARATUS FOR SUCCESSIVELY TESTING ELECTRONI...
- Publication number 20100148793
- Publication date Jun 17, 2010
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Test Apparatus and Method of Configuring Electron...
- Publication number 20080042667
- Publication date Feb 21, 2008
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Test Apparatus
- Publication number 20080038098
- Publication date Feb 14, 2008
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
Electronic device test apparatus
- Publication number 20070069752
- Publication date Mar 29, 2007
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
Electronic part test device
- Publication number 20060290369
- Publication date Dec 28, 2006
- Kazuyuki Yamashita
- G01 - MEASURING TESTING

Kazuyuki Yamashita

Person

Patents Grantslast 30 patents

Electronic device test apparatus and method of configuring electron...

Electronic device test apparatus for successively testing electroni...

Electronic device test apparatus for successively testing electroni...

Electronic device test apparatus

Electronic device tray electronic device tray, transporting apparat...

IC transporting apparatus, IC posture altering apparatus and IC tak...

IC transporting apparatus, IC posture altering apparatus and IC tak...

Lead press mechanism for IC test handler

Patents Applicationslast 30 patents

ELECTRONIC DEVICE TEST APPARATUS FOR SUCCESSIVELY TESTING ELECTRONI...

Electronic Device Test Apparatus and Method of Configuring Electron...

Electronic Device Test Apparatus

Electronic device test apparatus

Electronic part test device