Ke XIAO

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Via characterization for BCD and depth metrology
- Patent number 10,254,110
- Issue date Apr 9, 2019
- Nanometrics Incorporated
- Ke Xiao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VIA CHARACTERIZATION FOR BCD AND DEPTH METROLOGY
- Publication number 20150168128
- Publication date Jun 18, 2015
- Nanometrics Incorporated
- Ke XIAO
- G01 - MEASURING TESTING