KE YUAN

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HEFEI, CN

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Patents Grantslast 30 patents

Information Patent Grant
System and method for detecting centroid of complementary single pixel
- Patent number 11,940,348
- Issue date Mar 26, 2024
- Hefei Institutes of Physical Science, Chinese Academy of Sciences
- Dongfeng Shi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DETECTING CENTROID OF COMPLEMENTARY SINGLE PIXEL
- Publication number 20240094086
- Publication date Mar 21, 2024
- Hefei Institutes of Physical Science, Chinese Academy of Sciences
- Dongfeng SHI
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC DETECTION AND ACQUISITION SYSTEM AND CENTROID DETECTI...
- Publication number 20220365211
- Publication date Nov 17, 2022
- Hefei Institutes of Physical Science, Chinese Academy of Sciences
- Yingjian WANG
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY MARK, OVERLAY MARKING METHOD AND OVERLAY MEASURING METHOD
- Publication number 20220082951
- Publication date Mar 17, 2022
- Nexchip Semiconductor Corporation
- KUOTUNG YANG
- H01 - BASIC ELECTRIC ELEMENTS