Kedao Wang

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dimensional measurement method based on deep learning
- Patent number 11,854,182
- Issue date Dec 26, 2023
- UNITX, INC.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fused imaging device and method
- Patent number 11,763,442
- Issue date Sep 19, 2023
- UNITX, INC.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fused imaging device and method
- Patent number 11,734,812
- Issue date Aug 22, 2023
- UNITX, INC.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMBINING DEFECT NEURAL NETWORK WITH LOCATION NEURAL NETWORK
- Publication number 20240303794
- Publication date Sep 12, 2024
- UnitX, Inc.
- Weixiong Zheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dimensional Measurement Method Based on Deep Learning
- Publication number 20240062358
- Publication date Feb 22, 2024
- UnitX, Inc.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIMENSIONAL MEASUREMENT METHOD BASED ON DEEP LEARNING
- Publication number 20230061004
- Publication date Mar 2, 2023
- UnitX, Inc.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUSED IMAGING DEVICE AND METHOD
- Publication number 20220301144
- Publication date Sep 22, 2022
- UnitX, Inc.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUSED IMAGING DEVICE AND METHOD
- Publication number 20220301145
- Publication date Sep 22, 2022
- UnitX, Inc.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NEURAL NETWORK TRAINING METHOD, DEVICE AND STORAGE MEDIUM BASED ON...
- Publication number 20210342688
- Publication date Nov 4, 2021
- UnitX, Inc.
- Kedao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION DEVICE AND METHOD
- Publication number 20210150700
- Publication date May 20, 2021
- UnitX, Inc.
- Kedao Wang
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Dimensional measurement method based on deep learning

Fused imaging device and method

Fused imaging device and method

Patents Applicationslast 30 patents

COMBINING DEFECT NEURAL NETWORK WITH LOCATION NEURAL NETWORK

Dimensional Measurement Method Based on Deep Learning

DIMENSIONAL MEASUREMENT METHOD BASED ON DEEP LEARNING

FUSED IMAGING DEVICE AND METHOD

FUSED IMAGING DEVICE AND METHOD

NEURAL NETWORK TRAINING METHOD, DEVICE AND STORAGE MEDIUM BASED ON...

DEFECT DETECTION DEVICE AND METHOD