Kei Kanemoto

Person

Fujimi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Attached substance determination method, attached substance determi...
- Patent number 11,262,315
- Issue date Mar 1, 2022
- Seiko Epson Corporation
- Kei Kanemoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
- Patent number 10,823,570
- Issue date Nov 3, 2020
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor, method for manufacturing physical quantit...
- Patent number 10,697,773
- Issue date Jun 30, 2020
- Seiko Epson Corporation
- Makoto Furuhata
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Circuit device, physical quantity detection device, electronic appa...
- Patent number 10,670,428
- Issue date Jun 2, 2020
- Seiko Epson Corporation
- Ryuta Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Gyro sensor, electronic apparatus, and vehicle
- Patent number 10,627,234
- Issue date Apr 21, 2020
- Seiko Epson Corporation
- Takayuki Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity detection circuit, angular velocity detection devi...
- Patent number 10,302,672
- Issue date May 28, 2019
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Gyro sensor, electronic device, mobile apparatus, and manufacturing...
- Patent number 9,970,763
- Issue date May 15, 2018
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Functional element, electronic device, electronic apparatus, and mo...
- Patent number 9,846,442
- Issue date Dec 19, 2017
- Seiko Epson Corporation
- Kei Kanemoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Functional element, electronic device, electronic apparatus, and mo...
- Patent number 9,798,332
- Issue date Oct 24, 2017
- Seiko Epson Corporation
- Kei Kanemoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Gyro sensor and electronic apparatus
- Patent number 9,470,525
- Issue date Oct 18, 2016
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Gyro sensor and electronic apparatus
- Patent number 9,389,078
- Issue date Jul 12, 2016
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor and electronic device
- Patent number 9,273,962
- Issue date Mar 1, 2016
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Gyro sensor and electronic apparatus
- Patent number 9,243,908
- Issue date Jan 26, 2016
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor and electronic apparatus
- Patent number 9,157,927
- Issue date Oct 13, 2015
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Gyro sensor and electronic device
- Patent number 9,038,461
- Issue date May 26, 2015
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor and electronic apparatus
- Patent number 8,736,254
- Issue date May 27, 2014
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
MEMS sensor, MEMS sensor manufacturing method, and electronic device
- Patent number 8,338,896
- Issue date Dec 25, 2012
- Seiko Epson Corporation
- Kei Kanemoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing ink jet recording head
- Patent number 8,037,604
- Issue date Oct 18, 2011
- Seiko Epson Corporation
- Kei Kanemoto
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Inkjet recording head, inkjet recording device, and method for manu...
- Patent number 7,938,506
- Issue date May 10, 2011
- Seiko Epson Corporation
- Kei Kanemoto
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Semiconductor device and method for manufacturing thereof
- Patent number 7,625,784
- Issue date Dec 1, 2009
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,622,359
- Issue date Nov 24, 2009
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 7,569,438
- Issue date Aug 4, 2009
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor substrate and method for m...
- Patent number 7,524,705
- Issue date Apr 28, 2009
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor substrate, method for manufa...
- Patent number 7,507,643
- Issue date Mar 24, 2009
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,495,287
- Issue date Feb 24, 2009
- Seiko Epson Corporation
- Hideaki Oka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor substrate and method for man...
- Patent number 7,488,666
- Issue date Feb 10, 2009
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device
- Patent number 7,465,641
- Issue date Dec 16, 2008
- Seiko Epson Corporation
- Toshiki Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor substrate, method for manu...
- Patent number 7,452,781
- Issue date Nov 18, 2008
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor substrate and semiconductor d...
- Patent number 7,425,495
- Issue date Sep 16, 2008
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor substrate and method for man...
- Patent number 7,396,733
- Issue date Jul 8, 2008
- Seiko Epson Corporation
- Kei Kanemoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPECTRAL IMAGE ANALYSIS METHOD, SPECTRAL IMAGE ANALYSIS PROGRAM, AN...
- Publication number 20240248026
- Publication date Jul 25, 2024
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Information Processing Device, Information Processing System, And I...
- Publication number 20230053797
- Publication date Feb 23, 2023
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATTACHED SUBSTANCE DETERMINATION METHOD, ATTACHED SUBSTANCE DETERMI...
- Publication number 20210190701
- Publication date Jun 24, 2021
- SEIKO EPSON CORPORATION
- Kei Kanemoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Physical Quantity Sensor, Inertial Measurement Device, Vehicle Posi...
- Publication number 20190113341
- Publication date Apr 18, 2019
- SEIKO EPSON CORPORATION
- Kazuyuki NAGATA
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION DEVICE, VIBRATION DEVICE MODULE, ELECTRONIC DEVICE, AND V...
- Publication number 20180369863
- Publication date Dec 27, 2018
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
Physical Quantity Sensor, Method For Manufacturing Physical Quantit...
- Publication number 20180306581
- Publication date Oct 25, 2018
- SEIKO EPSON CORPORATION
- Makoto FURUHATA
- B60 - VEHICLES IN GENERAL
Information Patent Application
PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, ELECTRON...
- Publication number 20180283868
- Publication date Oct 4, 2018
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
GYRO SENSOR, ELECTRONIC APPARATUS, AND VEHICLE
- Publication number 20180238688
- Publication date Aug 23, 2018
- SEIKO EPSON CORPORATION
- Takayuki KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DEVICE, PHYSICAL QUANTITY DETECTION DEVICE, ELECTRONIC APPA...
- Publication number 20180052012
- Publication date Feb 22, 2018
- SEIKO EPSON CORPORATION
- Ryuta NISHIZAWA
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR VELOCITY DETECTION CIRCUIT, ANGULAR VELOCITY DETECTION DEVI...
- Publication number 20170254833
- Publication date Sep 7, 2017
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
DRIVE CIRCUIT, ANGULAR VELOCITY DETECTION DEVICE, ELECTRONIC APPARA...
- Publication number 20170254644
- Publication date Sep 7, 2017
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR VELOCITY DETECTION CIRCUIT, ANGULAR VELOCITY DETECTION DEVI...
- Publication number 20170254645
- Publication date Sep 7, 2017
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
GYRO SENSOR, ELECTRONIC DEVICE, MOBILE APPARATUS, AND MANUFACTURING...
- Publication number 20160258753
- Publication date Sep 8, 2016
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, ELECTRONIC APPARATUS, AND MOVING OBJECT
- Publication number 20150247877
- Publication date Sep 3, 2015
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL ELEMENT, ELECTRONIC DEVICE, ELECTRONIC APPARATUS, AND MO...
- Publication number 20150212526
- Publication date Jul 30, 2015
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G05 - CONTROLLING REGULATING
Information Patent Application
PHYSICAL QUANTITY SENSOR AND ELECTRONIC APPARATUS
- Publication number 20140224017
- Publication date Aug 14, 2014
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
GYRO SENSOR AND ELECTRONIC APPARATUS
- Publication number 20130276536
- Publication date Oct 24, 2013
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
GYRO SENSOR AND ELECTRONIC APPARATUS
- Publication number 20130263664
- Publication date Oct 10, 2013
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
GYRO SENSOR AND ELECTRONIC APPARATUS
- Publication number 20130255378
- Publication date Oct 3, 2013
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
GYRO SENSOR AND ELECTRONIC DEVICE
- Publication number 20120291548
- Publication date Nov 22, 2012
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSOR AND ELECTRONIC DEVICE
- Publication number 20120210789
- Publication date Aug 23, 2012
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSOR AND ELECTRONIC APPARATUS
- Publication number 20110291644
- Publication date Dec 1, 2011
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSOR, ELECTRONIC DEVICE, AND METHOD OF MANUFACT...
- Publication number 20110115038
- Publication date May 19, 2011
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PHYSICAL QUANTITY SENSOR, MANUFACTURING METHOD OF PHYSICAL QUANTITY...
- Publication number 20110056296
- Publication date Mar 10, 2011
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS SENSOR, ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING MEMS SE...
- Publication number 20110049653
- Publication date Mar 3, 2011
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR, MEMS SENSOR MANUFACTURING METHOD, AND ELECTRONIC DEVICE
- Publication number 20100242606
- Publication date Sep 30, 2010
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR, MEMS SENSOR MANUFACTURING METHOD, AND ELECTRONIC DEVICE
- Publication number 20100244160
- Publication date Sep 30, 2010
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- G01 - MEASURING TESTING
Information Patent Application
INKJET RECORDING HEAD, INKJET RECORDING DEVICE, AND METHOD FOR MANU...
- Publication number 20090237454
- Publication date Sep 24, 2009
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
METHOD FOR MANUFACTURING INK JET RECORDING HEAD, INK JET RECORDING...
- Publication number 20090237468
- Publication date Sep 24, 2009
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080237778
- Publication date Oct 2, 2008
- SEIKO EPSON CORPORATION
- Kei KANEMOTO
- H01 - BASIC ELECTRIC ELEMENTS

Kei Kanemoto

Person

Patents Grantslast 30 patents

Attached substance determination method, attached substance determi...

Physical quantity sensor, physical quantity sensor device, electron...

Physical quantity sensor, method for manufacturing physical quantit...

Circuit device, physical quantity detection device, electronic appa...

Gyro sensor, electronic apparatus, and vehicle

Angular velocity detection circuit, angular velocity detection devi...

Gyro sensor, electronic device, mobile apparatus, and manufacturing...

Functional element, electronic device, electronic apparatus, and mo...

Functional element, electronic device, electronic apparatus, and mo...

Gyro sensor and electronic apparatus

Gyro sensor and electronic apparatus

Physical quantity sensor and electronic device

Gyro sensor and electronic apparatus

Physical quantity sensor and electronic apparatus

Gyro sensor and electronic device

Physical quantity sensor and electronic apparatus

MEMS sensor, MEMS sensor manufacturing method, and electronic device

Method of manufacturing ink jet recording head

Inkjet recording head, inkjet recording device, and method for manu...

Semiconductor device and method for manufacturing thereof

Method for manufacturing semiconductor device

Method of manufacturing semiconductor device

Method for manufacturing a semiconductor substrate and method for m...

Method for manufacturing semiconductor substrate, method for manufa...

Semiconductor device and manufacturing method thereof

Method for manufacturing semiconductor substrate and method for man...

Method for manufacturing a semiconductor device

Method for manufacturing a semiconductor substrate, method for manu...

Method of manufacturing semiconductor substrate and semiconductor d...

Method for manufacturing semiconductor substrate and method for man...

Patents Applicationslast 30 patents

SPECTRAL IMAGE ANALYSIS METHOD, SPECTRAL IMAGE ANALYSIS PROGRAM, AN...

Information Processing Device, Information Processing System, And I...

ATTACHED SUBSTANCE DETERMINATION METHOD, ATTACHED SUBSTANCE DETERMI...

Physical Quantity Sensor, Inertial Measurement Device, Vehicle Posi...

VIBRATION DEVICE, VIBRATION DEVICE MODULE, ELECTRONIC DEVICE, AND V...

Physical Quantity Sensor, Method For Manufacturing Physical Quantit...

PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, ELECTRON...

GYRO SENSOR, ELECTRONIC APPARATUS, AND VEHICLE

CIRCUIT DEVICE, PHYSICAL QUANTITY DETECTION DEVICE, ELECTRONIC APPA...

ANGULAR VELOCITY DETECTION CIRCUIT, ANGULAR VELOCITY DETECTION DEVI...

DRIVE CIRCUIT, ANGULAR VELOCITY DETECTION DEVICE, ELECTRONIC APPARA...

ANGULAR VELOCITY DETECTION CIRCUIT, ANGULAR VELOCITY DETECTION DEVI...

GYRO SENSOR, ELECTRONIC DEVICE, MOBILE APPARATUS, AND MANUFACTURING...

ELECTRONIC DEVICE, ELECTRONIC APPARATUS, AND MOVING OBJECT

FUNCTIONAL ELEMENT, ELECTRONIC DEVICE, ELECTRONIC APPARATUS, AND MO...

PHYSICAL QUANTITY SENSOR AND ELECTRONIC APPARATUS

GYRO SENSOR AND ELECTRONIC APPARATUS

GYRO SENSOR AND ELECTRONIC APPARATUS

GYRO SENSOR AND ELECTRONIC APPARATUS

GYRO SENSOR AND ELECTRONIC DEVICE

PHYSICAL QUANTITY SENSOR AND ELECTRONIC DEVICE

PHYSICAL QUANTITY SENSOR AND ELECTRONIC APPARATUS

PHYSICAL QUANTITY SENSOR, ELECTRONIC DEVICE, AND METHOD OF MANUFACT...

PHYSICAL QUANTITY SENSOR, MANUFACTURING METHOD OF PHYSICAL QUANTITY...

MEMS SENSOR, ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING MEMS SE...

MEMS SENSOR, MEMS SENSOR MANUFACTURING METHOD, AND ELECTRONIC DEVICE

MEMS SENSOR, MEMS SENSOR MANUFACTURING METHOD, AND ELECTRONIC DEVICE

INKJET RECORDING HEAD, INKJET RECORDING DEVICE, AND METHOD FOR MANU...

METHOD FOR MANUFACTURING INK JET RECORDING HEAD, INK JET RECORDING...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME