Kei Matsumoto

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring impurity metal concentration
- Patent number 7,141,992
- Issue date Nov 28, 2006
- Komatsu Electronic Metals Co., Ltd.
- Ryuuji Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating an SOI substrate
- Patent number 5,866,468
- Issue date Feb 2, 1999
- Komatsu Electronic Metal Co., Ltd.
- Mitsuo Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing a surface of a semiconductor substrate
- Patent number 5,849,603
- Issue date Dec 15, 1998
- Komatsu Electronic Metals Co., Ltd.
- Hirotaka Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon-on-insulator substrate and a method for fabricating the same
- Patent number 5,770,511
- Issue date Jun 23, 1998
- Komatsu Electronic Metals Co., Ltd.
- Kei Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating a density of oxygen-precipitation defects in a...
- Patent number 5,742,175
- Issue date Apr 21, 1998
- Komatsu Electronic Metals, Inc.
- Hirotaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a Fe-B concentration of a silicon wafer
- Patent number 5,742,176
- Issue date Apr 21, 1998
- Komatsu Electronic Metals Co., Ltd.
- Hirotaka Kato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for measuring impurity metal concentration
- Publication number 20060066324
- Publication date Mar 30, 2006
- KOMATSU ELECTRONIC METALS CO., LTD.
- Ryuuji Ohno
- G01 - MEASURING TESTING