TREA

Kei SHIBAYAMA

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Examination device
    • Patent number 11,946,858
    • Issue date Apr 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro Satou
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    WAFER INSPECTION APPARATUS
    • Publication number 20250004043
    • Publication date Jan 2, 2025
    • Hitachi High-Tech Corporation
    • Yoshihiro SATOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    EXAMINATION DEVICE
    • Publication number 20210404946
    • Publication date Dec 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro SATOU
    • G01 - MEASURING TESTING