Kei Shimura

Person

Mito, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Far-infrared spectroscopy device
- Patent number 12,196,670
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Touya Ono
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopy device and far-infrared spectroscopy method
- Patent number 11,977,026
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Mizuki Mohara
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared light source and far-infrared spectrometer
- Patent number 11,644,418
- Issue date May 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopy device
- Patent number 11,320,309
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Kei Shimura
- G02 - OPTICS
Information Patent Grant
Far-infrared spectroscopy device
- Patent number 11,079,275
- Issue date Aug 3, 2021
- HITACHI HIGH-TECH CORPORATION
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopic device and far-infrared spectroscopic me...
- Patent number 11,016,023
- Issue date May 25, 2021
- Hitachi High-Technologies Corporation
- Mizuki Mohara
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopy device
- Patent number 10,948,347
- Issue date Mar 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared imaging device and far-infrared imaging method
- Patent number 10,613,026
- Issue date Apr 7, 2020
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared imaging device and far-infrared imaging method
- Patent number 10,203,278
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave generating device and spectroscopic device using same
- Patent number 10,113,959
- Issue date Oct 30, 2018
- Hitachi High-Technologies Corporation
- Kenji Aiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection method and its device
- Patent number 9,976,966
- Issue date May 22, 2018
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Optical microscope device and testing apparatus comprising same
- Patent number 9,851,548
- Issue date Dec 26, 2017
- Hitachi High-Technologies Corporation
- Kei Shimura
- G02 - OPTICS
Information Patent Grant
Defect inspection method and its device
- Patent number 9,513,228
- Issue date Dec 6, 2016
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 9,194,795
- Issue date Nov 24, 2015
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Device for detecting foreign matter and method for detecting foreig...
- Patent number 9,164,042
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 9,151,719
- Issue date Oct 6, 2015
- Hitachi High-Technologies Corporation
- Koichi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,976,347
- Issue date Mar 10, 2015
- Hitachi High-Technologies Corporation
- Mizuki Oku
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 8,921,798
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting device and defect inspecting method
- Patent number 8,879,821
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,611,640
- Issue date Dec 17, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for visual inspection
- Patent number 8,472,697
- Issue date Jun 25, 2013
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect inspection apparatus and method
- Patent number 8,467,048
- Issue date Jun 18, 2013
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,351,683
- Issue date Jan 8, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect inspection apparatus and method
- Patent number 8,233,145
- Issue date Jul 31, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for visual inspection
- Patent number 8,194,969
- Issue date Jun 5, 2012
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for visual inspection
- Patent number 8,131,058
- Issue date Mar 6, 2012
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for visual inspection
- Patent number 8,126,259
- Issue date Feb 28, 2012
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,953,567
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for visual inspection
- Patent number 7,821,644
- Issue date Oct 26, 2010
- Hitachi High-Technologies Corporation
- Mitsuhiro Kamei
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect inspection apparatus and method
- Patent number 7,746,453
- Issue date Jun 29, 2010
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Far-Infrared Spectroscopy Device and Sample Adapter
- Publication number 20240288365
- Publication date Aug 29, 2024
- Hitachi High-Tech Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device
- Publication number 20230236123
- Publication date Jul 27, 2023
- Hitachi High-Tech Corporation
- Touya ONO
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device and Far-Infrared Spectroscopy Method
- Publication number 20220412885
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Light Source and Far-Infrared Spectrometer
- Publication number 20210381965
- Publication date Dec 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Kei SHIMURA
- G01 - MEASURING TESTING
Information Patent Application
FAR-INFRARED SPECTROSCOPY DEVICE
- Publication number 20210310865
- Publication date Oct 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Kei SHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopic Device and Far-Infrared Spectroscopic Me...
- Publication number 20210131957
- Publication date May 6, 2021
- Hitachi High-Technologies Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Light Source and Far-Infrared Spectrometer
- Publication number 20200371023
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Kei SHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device
- Publication number 20200088577
- Publication date Mar 19, 2020
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G02 - OPTICS
Information Patent Application
Far-Infrared Imaging Device and Far-Infrared Imaging Method
- Publication number 20190145892
- Publication date May 16, 2019
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device
- Publication number 20180209848
- Publication date Jul 26, 2018
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G02 - OPTICS
Information Patent Application
Terahertz Wave Generating Device and Spectroscopic Device Using Same
- Publication number 20180031469
- Publication date Feb 1, 2018
- Hitachi High-Technologies Corporation
- Kenji AIKO
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION METHOD AND ITS DEVICE
- Publication number 20170102338
- Publication date Apr 13, 2017
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Imaging Device and Far-Infrared Imaging Method
- Publication number 20160299064
- Publication date Oct 13, 2016
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20150102229
- Publication date Apr 16, 2015
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND ITS DEVICE
- Publication number 20150022806
- Publication date Jan 22, 2015
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140333923
- Publication date Nov 13, 2014
- Hitachi High-Technologies Corporation
- Koichi Taniguchi
- G02 - OPTICS
Information Patent Application
OPTICAL MICROSCOPE DEVICE AND TESTING APPARATUS COMPRISING SAME
- Publication number 20140210983
- Publication date Jul 31, 2014
- Hitachi High-Technologies Corporation
- Kei Shimura
- G02 - OPTICS
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140160470
- Publication date Jun 12, 2014
- Hitachi High-Technologies Corporation
- Mizuki Oku
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus And Defect Inspection Method
- Publication number 20140042332
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIG...
- Publication number 20130320216
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130148113
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Mizuki Oku
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130100446
- Publication date Apr 25, 2013
- HITACHI HIGH-TECNOLOGIES CORPORATION
- Hiroyuki YAASHITA
- G01 - MEASURING TESTING
Information Patent Application
FAR INFRARED IMAGING DEVICE AND IMAGING METHOD USING SAME
- Publication number 20130088590
- Publication date Apr 11, 2013
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING DEVICE AND DEFECT INSPECTING METHOD
- Publication number 20130011043
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Application
PATTERN DEFECT INSPECTION APPARATUS AND METHOD
- Publication number 20120268734
- Publication date Oct 25, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi NISHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR VISUAL INSPECTION
- Publication number 20120114222
- Publication date May 10, 2012
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DEFECT INSPECTING APPARATUS AND METHOD
- Publication number 20110221886
- Publication date Sep 15, 2011
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING AN OBJECT SURFACE DEFECT
- Publication number 20110141272
- Publication date Jun 16, 2011
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR VISUAL INSPECTION
- Publication number 20110019200
- Publication date Jan 27, 2011
- Hitachi High-Technologies Corporation
- Mitsuhiro Kamei
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR VISUAL INSPECTION
- Publication number 20100239156
- Publication date Sep 23, 2010
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING

Kei Shimura

Person

Patents Grantslast 30 patents

Far-infrared spectroscopy device

Far-infrared spectroscopy device and far-infrared spectroscopy method

Far-infrared light source and far-infrared spectrometer

Far-infrared spectroscopy device

Far-infrared spectroscopy device

Far-infrared spectroscopic device and far-infrared spectroscopic me...

Far-infrared spectroscopy device

Far-infrared imaging device and far-infrared imaging method

Far-infrared imaging device and far-infrared imaging method

Terahertz wave generating device and spectroscopic device using same

Defect inspection method and its device

Optical microscope device and testing apparatus comprising same

Defect inspection method and its device

Defect inspection apparatus and defect inspection method

Device for detecting foreign matter and method for detecting foreig...

Inspection apparatus

Inspection apparatus

Defect inspection apparatus and defect inspection method

Defect inspecting device and defect inspecting method

Inspection apparatus and inspection method

Method and apparatus for visual inspection

Pattern defect inspection apparatus and method

Inspection apparatus and inspection method

Pattern defect inspection apparatus and method

Method and apparatus for visual inspection

Method and apparatus for visual inspection

Method and apparatus for visual inspection

Defect inspection apparatus and defect inspection method

Apparatus for visual inspection

Pattern defect inspection apparatus and method

Patents Applicationslast 30 patents

Far-Infrared Spectroscopy Device and Sample Adapter

Far-Infrared Spectroscopy Device

Far-Infrared Spectroscopy Device and Far-Infrared Spectroscopy Method

Far-Infrared Light Source and Far-Infrared Spectrometer

FAR-INFRARED SPECTROSCOPY DEVICE

Far-Infrared Spectroscopic Device and Far-Infrared Spectroscopic Me...

Far-Infrared Light Source and Far-Infrared Spectrometer

Far-Infrared Spectroscopy Device

Far-Infrared Imaging Device and Far-Infrared Imaging Method

Far-Infrared Spectroscopy Device

Terahertz Wave Generating Device and Spectroscopic Device Using Same

DEFECT INSPECTION METHOD AND ITS DEVICE

Far-Infrared Imaging Device and Far-Infrared Imaging Method

Defect Inspection Apparatus and Defect Inspection Method

DEFECT INSPECTION METHOD AND ITS DEVICE

INSPECTION APPARATUS

OPTICAL MICROSCOPE DEVICE AND TESTING APPARATUS COMPRISING SAME

INSPECTION APPARATUS

Defect Inspection Apparatus And Defect Inspection Method

DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIG...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

FAR INFRARED IMAGING DEVICE AND IMAGING METHOD USING SAME

DEFECT INSPECTING DEVICE AND DEFECT INSPECTING METHOD

PATTERN DEFECT INSPECTION APPARATUS AND METHOD

METHOD AND APPARATUS FOR VISUAL INSPECTION

PATTERN DEFECT INSPECTING APPARATUS AND METHOD

APPARATUS AND METHOD FOR INSPECTING AN OBJECT SURFACE DEFECT

APPARATUS FOR VISUAL INSPECTION

METHOD AND APPARATUS FOR VISUAL INSPECTION