Kei SHIOYA

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device
- Patent number 11,965,902
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Kei Shioya
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and cleaning mechanism in automatic analy...
- Patent number 10,603,667
- Issue date Mar 31, 2020
- Hitachi High-Technologies Corporation
- Kei Shioya
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20210080478
- Publication date Mar 18, 2021
- Hitachi High-Technologies Corporation
- Kei SHIOYA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Device and Cleaning Mechanism in Automatic Analy...
- Publication number 20190351424
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Kei SHIOYA
- B08 - CLEANING