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Kei YAMAGUCHI
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Matsumoto-city, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
9,548,253
Issue date
Jan 17, 2017
Fuji Electric Co., Ltd.
Kei Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing and evaluation method of a semiconductor device
Patent number
9,355,943
Issue date
May 31, 2016
Fuji Electric Co., Ltd.
Yuko Nakamata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pressure detecting apparatus
Patent number
7,234,358
Issue date
Jun 26, 2007
Fuji Electric Device Technology Co., Ltd.
Kazunori Saito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MANUFACTURING AND EVALUATION METHOD OF A SEMICONDUCTOR DEVICE
Publication number
20160211201
Publication date
Jul 21, 2016
Fuji Electric Co., Ltd.
Yuko NAKAMATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20150069601
Publication date
Mar 12, 2015
Fuji Electric Co., Ltd.
Kei YAMAGUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20140210060
Publication date
Jul 31, 2014
Fuji Electric Co., Ltd.
Yuko NAKAMATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pressure detecting apparatus
Publication number
20060243054
Publication date
Nov 2, 2006
Fuji Electric Device Technology Co., Ltd.
Kazunori Saito
G01 - MEASURING TESTING