Keiichi Azuma

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
ZIF connector and semiconductor-testing apparatus using the same
- Patent number 7,004,776
- Issue date Feb 28, 2006
- J.S.T. Mfg. Co., Ltd.
- Akihiko Otsu
- G01 - MEASURING TESTING
Information Patent Grant
Connector
- Patent number 6,979,226
- Issue date Dec 27, 2005
- J.S.T. Mfg. Co., Ltd.
- Akihiko Otsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ZIF connector and semiconductor-testing apparatus using the same
- Publication number 20050142918
- Publication date Jun 30, 2005
- Akihiko Otsu
- G01 - MEASURING TESTING
Information Patent Application
Connector
- Publication number 20050032430
- Publication date Feb 10, 2005
- Akihiko Otsu
- H01 - BASIC ELECTRIC ELEMENTS