Keiichi KENMOTSU

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Film thickness measurement apparatus and film thickness measurement...
- Patent number 8,988,668
- Issue date Mar 24, 2015
- Mitsubishi Hitachi Power Systems, Ltd.
- Masaaki Kurokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASUREMENT APPARATUS AND FILM THICKNESS MEASUREMENT...
- Publication number 20140192349
- Publication date Jul 10, 2014
- Mitsubishi Heavy Industries, Ltd.
- Masaaki Kurokawa
- G01 - MEASURING TESTING
Information Patent Application
CONDITION DIAGNOSING METHOD AND CONDITION DIAGNOSING DEVICE
- Publication number 20140107977
- Publication date Apr 17, 2014
- MITSUBISHI AIRCRAFT CORPORATION
- Yasuo FUJISHIMA
- G06 - COMPUTING CALCULATING COUNTING