Keiichi MORIKAWA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis assistance device and x-ray analysis device
- Patent number 10,976,272
- Issue date Apr 13, 2021
- Rigaku Corporation
- Yayoi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray topography apparatus
- Patent number 9,658,174
- Issue date May 23, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus
- Patent number 9,218,315
- Issue date Dec 22, 2015
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 9,128,029
- Issue date Sep 8, 2015
- Rigaku Corporation
- Keiichi Morikawa
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for X-ray diffraction measurement data
- Patent number 8,971,492
- Issue date Mar 3, 2015
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 7,711,091
- Issue date May 4, 2010
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS ASSISTANCE DEVICE AND X-RAY ANALYSIS DEVICE
- Publication number 20200191732
- Publication date Jun 18, 2020
- Rigaku Corporation
- YAYOI TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TOPOGRAPHY APPARATUS
- Publication number 20150146858
- Publication date May 28, 2015
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20130136236
- Publication date May 30, 2013
- Rigaku Corporation
- Keiichi MORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20130138382
- Publication date May 30, 2013
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA
- Publication number 20130077754
- Publication date Mar 28, 2013
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
X-ray analysis apparatus
- Publication number 20080056452
- Publication date Mar 6, 2008
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING