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Keiichi Nakada
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Munchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Thermal flow rate measuring device
Patent number
RE42529
Issue date
Jul 12, 2011
Hitachi, Ltd.
Izumi Watanabe
073 - Measuring and testing
Information
Patent Grant
Reduced resistance thermal flow measurement device
Patent number
7,721,599
Issue date
May 25, 2010
Hitachi, Ltd.
Masahiro Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Thermal flowmeter for measuring a flow rate of fluid
Patent number
7,631,555
Issue date
Dec 15, 2009
Hitachi, Ltd.
Hiroshi Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Thermal type flow measuring apparatus
Patent number
7,409,859
Issue date
Aug 12, 2008
Hitachi, Ltd.
Izumi Watanabe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Thermal Flow Measurement Device
Publication number
20090000372
Publication date
Jan 1, 2009
Masahiro Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
Thermal flowmeter of fluid
Publication number
20070125169
Publication date
Jun 7, 2007
Hitachi, Ltd
Hiroshi Nakano
G01 - MEASURING TESTING
Information
Patent Application
Gas flow measuring apparatus
Publication number
20070089504
Publication date
Apr 26, 2007
Keiji Hanzawa
G01 - MEASURING TESTING
Information
Patent Application
Thermal type flow measuring apparatus
Publication number
20070024119
Publication date
Feb 1, 2007
Izumi Watanabe
G01 - MEASURING TESTING