Keiichi Nakamoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for generating tool paths
- Patent number 11,556,110
- Issue date Jan 17, 2023
- Makino Milling Machine Co., Ltd.
- Keiichi Nakamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Atomic force microscope and method of energy dissipation imaging us...
- Patent number 7,387,016
- Issue date Jun 17, 2008
- Jeol Ltd.
- Keiichi Nakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Specimen observation method in atomic force microscopy and atomic f...
- Patent number 6,983,644
- Issue date Jan 10, 2006
- Jeol Ltd.
- Kazushi Yamanaka
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope having graphical information
- Patent number 6,294,774
- Issue date Sep 25, 2001
- Jeol Ltd.
- Takashi Ito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of analyzing sample using same
- Patent number 6,127,682
- Issue date Oct 3, 2000
- Jeol Ltd.
- Keiichi Nakamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner for scanning tunneling microscope
- Patent number 5,223,713
- Issue date Jun 29, 1993
- Jeol Ltd.
- Kiyohiko Uozumi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TOOL SELECTION METHOD, DEVICE, AND TOOL PATH GENERATION METHOD
- Publication number 20220128964
- Publication date Apr 28, 2022
- MAKINO MILLING MACHINE CO., LTD.
- Keiichi NAKAMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND DEVICE FOR GENERATING TOOL PATHS
- Publication number 20210003992
- Publication date Jan 7, 2021
- MAKINO MILLING MACHINE CO., LTD.
- Keiichi Nakamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Atomic force microscope and method of energy dissipation imaging us...
- Publication number 20060213260
- Publication date Sep 28, 2006
- JEOL Ltd.
- Keiichi Nakamoto
- G01 - MEASURING TESTING
Information Patent Application
Specimen observation method in atomic force microscopy and atomic f...
- Publication number 20020166368
- Publication date Nov 14, 2002
- JEOL Ltd.
- Kazushi Yamanaka
- B82 - NANO-TECHNOLOGY