Keiichi Nakanishi

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Turugashima-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor strain gauge and the manufacturing method
- Patent number 8,063,457
- Issue date Nov 22, 2011
- Tanita Corporation
- Ikuo Hakomori
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor strain gauge and the manufacturing method
- Patent number 7,666,699
- Issue date Feb 23, 2010
- Tanita Corporation
- Ikuo Hakomori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor strain gauge and the manufacturing method
- Publication number 20100065933
- Publication date Mar 18, 2010
- TANITA CORPORATION
- Ikuo Hakomori
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor strain gauge and the manufacturing method
- Publication number 20070254387
- Publication date Nov 1, 2007
- TANITA CORPORATION
- Ikuo Hakomori
- G01 - MEASURING TESTING