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Keiichi Okamoto
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Yokohama, JP
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last 30 patents
Information
Patent Grant
Development support system
Patent number
5,767,848
Issue date
Jun 16, 1998
Hitachi, Ltd.
Kichie Matsuzaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for alignment
Patent number
4,777,641
Issue date
Oct 11, 1988
Hitachi, Ltd.
Akira Inagaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern test apparatus including a plurality of pattern generators
Patent number
4,744,047
Issue date
May 10, 1988
Hitachi, Ltd.
Keiichi Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Projection alignment method and apparatus
Patent number
4,708,484
Issue date
Nov 24, 1987
Hitachi, Ltd.
Yoshihiro Komeyama
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern checking apparatus
Patent number
4,628,531
Issue date
Dec 9, 1986
Hitachi, Ltd.
Keiichi Okamoto
G06 - COMPUTING CALCULATING COUNTING