Keiichi Takanashi

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for double-side polishing work
- Patent number 11,826,870
- Issue date Nov 28, 2023
- Sumco Corporation
- Mami Kubota
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for double-side polishing work
- Patent number 11,717,931
- Issue date Aug 8, 2023
- Sumco Corporation
- Mami Kubota
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for measuring transmittance of quartz crucible
- Patent number 11,703,452
- Issue date Jul 18, 2023
- Sumco Corporation
- Yasunobu Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manufacturing defect-free monocrystalline...
- Patent number 11,618,971
- Issue date Apr 4, 2023
- Sumco Corporation
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of evaluating inner circumference of quartz crucible and qua...
- Patent number 11,361,462
- Issue date Jun 14, 2022
- Sumco Corporation
- Yasunobu Shimizu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer placement position determination method and sem...
- Patent number 10,903,099
- Issue date Jan 26, 2021
- Sumco Corporation
- Ikuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon single crystal manufacturing method
- Patent number 10,472,733
- Issue date Nov 12, 2019
- Sumco Corporation
- Keiichi Takanashi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor wafer evaluation standard setting method, semiconduct...
- Patent number 10,261,125
- Issue date Apr 16, 2019
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing single crystal
- Patent number 9,816,199
- Issue date Nov 14, 2017
- Sumco Corporation
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and apparatus for polishing workpiece
- Patent number 9,707,659
- Issue date Jul 18, 2017
- Sumco Corporation
- Shinichi Ogata
- B24 - GRINDING POLISHING
Information Patent Grant
Method of producing silicon single crystal
- Patent number 9,708,731
- Issue date Jul 18, 2017
- Sumco Corporation
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Silicon single crystal manufacturing apparatus and silicon single c...
- Patent number 9,567,692
- Issue date Feb 14, 2017
- Sumco Corporation
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and apparatus for polishing work
- Patent number 9,289,876
- Issue date Mar 22, 2016
- Sumco Corporation
- Shinichi Ogata
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus of producing silicon single crystal and method of produci...
- Patent number 9,284,660
- Issue date Mar 15, 2016
- Sumco Corporation
- Keiichi Takanashi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Wafer polishing method
- Patent number 8,900,033
- Issue date Dec 2, 2014
- Sumco Corporation
- Kazushige Takaishi
- B24 - GRINDING POLISHING
Information Patent Grant
Silicon single crystal pull-up apparatus and method of manufacturin...
- Patent number 8,871,023
- Issue date Oct 28, 2014
- Sumco Corporation
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Mechanism for controlling melt level in single crystal pulling appa...
- Patent number 8,801,853
- Issue date Aug 12, 2014
- Sumco Corporation
- Keiichi Takanashi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Procedure for in-situ determination of thermal gradients at the cry...
- Patent number 8,673,075
- Issue date Mar 18, 2014
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for controlling diameter of a silicon crystal...
- Patent number 8,641,822
- Issue date Feb 4, 2014
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for controlling the growth process of a monocr...
- Patent number 8,545,623
- Issue date Oct 1, 2013
- Sumco Phoenix Corporation
- Benno Orschel
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting speed deviations between actual and nominal p...
- Patent number 8,496,765
- Issue date Jul 30, 2013
- Sumco Phoenix Corporation
- Benno Orschel
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for manufacturing silicon single crystal in which a crystall...
- Patent number 8,414,701
- Issue date Apr 9, 2013
- Sumco Corporation
- Keiichi Takanashi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Procedure for in-situ determination of thermal gradients at the cry...
- Patent number 8,221,545
- Issue date Jul 17, 2012
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Silicon single crystal pulling method
- Patent number 8,187,378
- Issue date May 29, 2012
- Sumco Corporation
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and apparatus for controlling diameter of a silicon crystal...
- Patent number 8,012,255
- Issue date Sep 6, 2011
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for pulling a single crystal
- Patent number 7,264,674
- Issue date Sep 4, 2007
- Sumitomo Mitsubishi Silicon Corporation
- Keiichi Takanashi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Device and method for measuring position of liquid surface or melt...
- Patent number 7,172,656
- Issue date Feb 6, 2007
- Sumitomo Mitsubishi Silicon Corporation
- Keiichi Takanashi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Crystal section shape measuring method
- Patent number 6,411,391
- Issue date Jun 25, 2002
- Sumitomo Metal Industries Ltd.
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods and a device for measuring melt surface temperature within...
- Patent number 6,187,090
- Issue date Feb 13, 2001
- Sumitomo Metal Industries, Ltd.
- Tokuji Maeda
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
DOUBLE-SIDE POLISHING APPARATUS AND DOUBLE-SIDE POLISHING METHOD FO...
- Publication number 20240261929
- Publication date Aug 8, 2024
- SUMCO CORPORATION
- Yuji MIYAZAKI
- B24 - GRINDING POLISHING
Information Patent Application
METHOD OF ESTIMATING OXYGEN CONCENTRATION IN SILICON SINGLE CRYSTAL...
- Publication number 20240019397
- Publication date Jan 18, 2024
- SUMCO CORPORATION
- Ippei SHIMOZAKI
- C30 - CRYSTAL GROWTH
Information Patent Application
MANUFACTURING METHOD OF SINGLE CRYSTALS
- Publication number 20230357950
- Publication date Nov 9, 2023
- SUMCO CORPORATION
- Yasunobu SHIMIZU
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING DEFECT-FREE MONOCRYSTALLINE...
- Publication number 20230228000
- Publication date Jul 20, 2023
- SUMCO CORPORATION
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Application
SINGLE CRYSTAL PRODUCTION APPARATUS AND SINGLE CRYSTAL PRODUCTION M...
- Publication number 20230220583
- Publication date Jul 13, 2023
- SUMCO CORPORATION
- Kenichi Nishioka
- C30 - CRYSTAL GROWTH
Information Patent Application
SYSTEM AND METHOD FOR PRODUCING SINGLE CRYSTAL
- Publication number 20230023541
- Publication date Jan 26, 2023
- SUMCO CORPORATION
- Kenichi Nishioka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING DEFECT-FREE MONOCRYSTALLINE...
- Publication number 20220098757
- Publication date Mar 31, 2022
- SUMCO CORPORATION
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Application
APPARATUS AND METHOD FOR DOUBLE-SIDE POLISHING WORK
- Publication number 20210245321
- Publication date Aug 12, 2021
- SUMCO CORPORATION
- Mami KUBOTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DOUBLE-SIDE POLISHING WORKPIECE
- Publication number 20210205949
- Publication date Jul 8, 2021
- SUMCO CORPORATION
- Mami KUBOTA
- B24 - GRINDING POLISHING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING TRANSMITTANCE OF QUARTZ CRUCIBLE
- Publication number 20210181106
- Publication date Jun 17, 2021
- SUMCO CORPORATION
- Yasunobu SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DOUBLE-SIDE POLISHING WORK
- Publication number 20200346319
- Publication date Nov 5, 2020
- SUMCO CORPORATION
- Mami KUBOTA
- B24 - GRINDING POLISHING
Information Patent Application
METHOD OF EVALUATING INNER CIRCUMFERENCE OF QUARTZ CRUCIBLE AND QUA...
- Publication number 20200118286
- Publication date Apr 16, 2020
- SUMCO CORPORATION
- Yasunobu SHIMIZU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER PLACEMENT POSITION DETERMINATION METHOD AND SEM...
- Publication number 20190172739
- Publication date Jun 6, 2019
- SUMCO CORPORATION
- Ikuhiro NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION STANDARD SETTING METHOD, SEMICONDUCT...
- Publication number 20180136279
- Publication date May 17, 2018
- SUMCO CORPORATION
- Takahiro NAGASAWA
- G01 - MEASURING TESTING
Information Patent Application
SILICON SINGLE CRYSTAL MANUFACTURING METHOD
- Publication number 20170096747
- Publication date Apr 6, 2017
- SUMCO CORPORATION
- Keiichi TAKANASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF MANUFACTURING SINGLE CRYSTAL
- Publication number 20160186359
- Publication date Jun 30, 2016
- SUMCO CORPORATION
- Keiichi TAKANASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF PRODUCING SILICON SINGLE CRYSTAL
- Publication number 20160145764
- Publication date May 26, 2016
- SUMCO CORPORATION
- Keiichi TAKANASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR POLISHING WORK
- Publication number 20150165585
- Publication date Jun 18, 2015
- SUMCO CORPORATION
- Shinichi Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR POLISHING WORKPIECE
- Publication number 20130337723
- Publication date Dec 19, 2013
- SUMCO CORPORATION
- Ryuichi Tanimoto
- B24 - GRINDING POLISHING
Information Patent Application
SILICON SINGLE CRYSTAL MANUFACTURING APPARATUS AND SILICON SINGLE C...
- Publication number 20130263773
- Publication date Oct 10, 2013
- SUMCO CORPORATION
- Keiichi TAKANASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
WAFER POLISHING METHOD
- Publication number 20130017763
- Publication date Jan 17, 2013
- Kazushige Takaishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCEDURE FOR IN-SITU DETERMINATION OF THERMAL GRADIENTS AT THE CRY...
- Publication number 20120186512
- Publication date Jul 26, 2012
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
APPARATUS OF PRODUCING SILICON SINGLE CRYSTAL AND METHOD OF PRODUCI...
- Publication number 20120145068
- Publication date Jun 14, 2012
- SUMCO CORPORATION
- Keiichi TAKANASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SILICON SINGLE CRYSTAL PULL-UP APPARATUS AND METHOD OF MANUFACTURIN...
- Publication number 20110259260
- Publication date Oct 27, 2011
- SUMCO CORPORATION
- Keiichi TAKANASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR CORRECTING SPEED DEVIATIONS BETWEEN ACTUAL AND NOMINAL P...
- Publication number 20110060467
- Publication date Mar 10, 2011
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF PRODUCING SILICON SINGLE CRYSTAL
- Publication number 20100319612
- Publication date Dec 23, 2010
- SUMCO CORPORATION
- Masao Saitou
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and apparatus for controlling the growth process of a monocr...
- Publication number 20100319611
- Publication date Dec 23, 2010
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...
- Publication number 20100206219
- Publication date Aug 19, 2010
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL
- Publication number 20100175611
- Publication date Jul 15, 2010
- SUMCO CORPORATION
- Keiichi Takanashi
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...
- Publication number 20100024716
- Publication date Feb 4, 2010
- Benno Orschel
- C30 - CRYSTAL GROWTH

Keiichi Takanashi

Person

Patents Grantslast 30 patents

Apparatus and method for double-side polishing work

Apparatus and method for double-side polishing work

Method and apparatus for measuring transmittance of quartz crucible

Method and apparatus for manufacturing defect-free monocrystalline...

Method of evaluating inner circumference of quartz crucible and qua...

Semiconductor wafer placement position determination method and sem...

Silicon single crystal manufacturing method

Semiconductor wafer evaluation standard setting method, semiconduct...

Method of manufacturing single crystal

Method and apparatus for polishing workpiece

Method of producing silicon single crystal

Silicon single crystal manufacturing apparatus and silicon single c...

Method and apparatus for polishing work

Apparatus of producing silicon single crystal and method of produci...

Wafer polishing method

Silicon single crystal pull-up apparatus and method of manufacturin...

Mechanism for controlling melt level in single crystal pulling appa...

Procedure for in-situ determination of thermal gradients at the cry...

Method and apparatus for controlling diameter of a silicon crystal...

Method and apparatus for controlling the growth process of a monocr...

Method for correcting speed deviations between actual and nominal p...

Method for manufacturing silicon single crystal in which a crystall...

Procedure for in-situ determination of thermal gradients at the cry...

Silicon single crystal pulling method

Method and apparatus for controlling diameter of a silicon crystal...

Method for pulling a single crystal

Device and method for measuring position of liquid surface or melt...

Crystal section shape measuring method

Methods and a device for measuring melt surface temperature within...

Patents Applicationslast 30 patents

DOUBLE-SIDE POLISHING APPARATUS AND DOUBLE-SIDE POLISHING METHOD FO...

METHOD OF ESTIMATING OXYGEN CONCENTRATION IN SILICON SINGLE CRYSTAL...

MANUFACTURING METHOD OF SINGLE CRYSTALS

METHOD AND APPARATUS FOR MANUFACTURING DEFECT-FREE MONOCRYSTALLINE...

SINGLE CRYSTAL PRODUCTION APPARATUS AND SINGLE CRYSTAL PRODUCTION M...

SYSTEM AND METHOD FOR PRODUCING SINGLE CRYSTAL

METHOD AND APPARATUS FOR MANUFACTURING DEFECT-FREE MONOCRYSTALLINE...

APPARATUS AND METHOD FOR DOUBLE-SIDE POLISHING WORK

APPARATUS AND METHOD FOR DOUBLE-SIDE POLISHING WORKPIECE

METHOD AND APPARATUS FOR MEASURING TRANSMITTANCE OF QUARTZ CRUCIBLE

APPARATUS AND METHOD FOR DOUBLE-SIDE POLISHING WORK

METHOD OF EVALUATING INNER CIRCUMFERENCE OF QUARTZ CRUCIBLE AND QUA...

SEMICONDUCTOR WAFER PLACEMENT POSITION DETERMINATION METHOD AND SEM...

SEMICONDUCTOR WAFER EVALUATION STANDARD SETTING METHOD, SEMICONDUCT...

SILICON SINGLE CRYSTAL MANUFACTURING METHOD

METHOD OF MANUFACTURING SINGLE CRYSTAL

METHOD OF PRODUCING SILICON SINGLE CRYSTAL

METHOD AND APPARATUS FOR POLISHING WORK

METHOD AND APPARATUS FOR POLISHING WORKPIECE

SILICON SINGLE CRYSTAL MANUFACTURING APPARATUS AND SILICON SINGLE C...

WAFER POLISHING METHOD

PROCEDURE FOR IN-SITU DETERMINATION OF THERMAL GRADIENTS AT THE CRY...

APPARATUS OF PRODUCING SILICON SINGLE CRYSTAL AND METHOD OF PRODUCI...

SILICON SINGLE CRYSTAL PULL-UP APPARATUS AND METHOD OF MANUFACTURIN...

METHOD FOR CORRECTING SPEED DEVIATIONS BETWEEN ACTUAL AND NOMINAL P...

METHOD OF PRODUCING SILICON SINGLE CRYSTAL

Method and apparatus for controlling the growth process of a monocr...

METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...

METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL

METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...