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Keiichi Tohyama
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Kanagawa-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
9,406,480
Issue date
Aug 2, 2016
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
8,946,631
Issue date
Feb 3, 2015
Ebara Corporation
Nobuharu Noji
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
8,742,341
Issue date
Jun 3, 2014
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
7,741,601
Issue date
Jun 22, 2010
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Information recording medium examining apparatus and method
Patent number
7,403,279
Issue date
Jul 22, 2008
Ebara Corporation
Keiichi Tohyama
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
7,365,324
Issue date
Apr 29, 2008
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus
Patent number
7,176,459
Issue date
Feb 13, 2007
Ebara Corporation
Kenji Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
7,138,629
Issue date
Nov 21, 2006
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Polishing apparatus having endpoint detection device
Patent number
5,672,091
Issue date
Sep 30, 1997
Ebara Corporation
Tsutomu Takahashi
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
TESTING APPARATUS USING CHARGED PARTICLES AND DEVICE MANUFACTURING...
Publication number
20150122993
Publication date
May 7, 2015
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
TESTING APPARATUS USING CHARGED PARTICLES AND DEVICE MANUFACTURING...
Publication number
20140158885
Publication date
Jun 12, 2014
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
Testing apparatus using charged particles and device manufacturing...
Publication number
20100237243
Publication date
Sep 23, 2010
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
Testing apparatus using charged particles and device manufacturing...
Publication number
20090101816
Publication date
Apr 23, 2009
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
Testing apparatus using charged particles and device manufacturing...
Publication number
20060169900
Publication date
Aug 3, 2006
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
Information recording medium examining apparatus and method
Publication number
20060087953
Publication date
Apr 27, 2006
EBARA CORPORATION
Keiichi Tohyama
G11 - INFORMATION STORAGE
Information
Patent Application
Electron beam apparatus
Publication number
20050253066
Publication date
Nov 17, 2005
EBARA CORPORATION
Kenji Watanabe
G01 - MEASURING TESTING
Information
Patent Application
Sample surface inspection method and inspection system
Publication number
20050194535
Publication date
Sep 8, 2005
EBARA CORPORATION
Nobuharu Noji
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Testing apparatus using charged particles and device manufacturing...
Publication number
20050045821
Publication date
Mar 3, 2005
Nobuharu Noji
G01 - MEASURING TESTING