Keiichi Yokota

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Nirasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe apparatus for measuring electrical characteristics of objects
- Patent number 5,416,592
- Issue date May 16, 1995
- Tokyo Electron Kabushiki Kaisha
- Shigeoki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 5,412,329
- Issue date May 2, 1995
- Tokyo Electron Yamanashi Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus with a swinging holder for an object of examination
- Patent number 5,404,111
- Issue date Apr 4, 1995
- Tokyo Electron Limited
- Shigeoki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning objects to be measured
- Patent number 4,966,520
- Issue date Oct 30, 1990
- Tokyo Electron Limited
- Keiichi Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Automatic wafer position aligning method for wafer prober
- Patent number 4,943,767
- Issue date Jul 24, 1990
- Tokyo Electron Limited
- Keiichi Yokota
- G01 - MEASURING TESTING