Keiichi Yoshizumi

Person

Higashiosaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Shape measuring apparatus and shape measuring method
- Patent number 8,006,402
- Issue date Aug 30, 2011
- Panasonic Corporation
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement device probe and shape measurement device
- Patent number 7,797,851
- Issue date Sep 21, 2010
- Panasonic Corporation
- Takanori Funabashi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement probe
- Patent number 7,520,067
- Issue date Apr 21, 2009
- Panasonic Corporation
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and using method for the same
- Patent number 7,065,893
- Issue date Jun 27, 2006
- Matsushita Electric Industrial Co., Ltd.
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transferring a thin plate
- Patent number 7,029,224
- Issue date Apr 18, 2006
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for quantitative quality inspection of substra...
- Patent number 7,012,680
- Issue date Mar 14, 2006
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring apparatus and method
- Patent number 6,934,036
- Issue date Aug 23, 2005
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Profilometer and method for measuring, and method for manufacturing...
- Patent number 6,763,319
- Issue date Jul 13, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Handa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring flatness of thin plate
- Patent number 6,710,883
- Issue date Mar 23, 2004
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thickness variation of a thin sh...
- Patent number 6,480,286
- Issue date Nov 12, 2002
- Matsushita Electric Inudstrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and method
- Patent number 6,026,583
- Issue date Feb 22, 2000
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Profile measuring apparatus
- Patent number 5,917,181
- Issue date Jun 29, 1999
- Marsushita Electric Industrial, Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring method and apparatus for optically detectin...
- Patent number 5,616,916
- Issue date Apr 1, 1997
- Matsushita Electric Industrial Co., Ltd.
- Koji Handa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for measuring width of micro gap
- Patent number 5,459,939
- Issue date Oct 24, 1995
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe
- Patent number 5,455,677
- Issue date Oct 3, 1995
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring birefringence without employing rotating me...
- Patent number 5,319,194
- Issue date Jun 7, 1994
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measuring apparatus
- Patent number 5,315,374
- Issue date May 24, 1994
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Error correcting method for measuring object surface using three-di...
- Patent number 5,283,630
- Issue date Feb 1, 1994
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring apparatus
- Patent number 5,144,150
- Issue date Sep 1, 1992
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical head apparatus for optical disc player
- Patent number 4,822,139
- Issue date Apr 18, 1989
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical measuring device
- Patent number 4,776,699
- Issue date Oct 11, 1988
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Optical information system having a birefringence plate movably dis...
- Patent number 4,766,303
- Issue date Aug 23, 1988
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical measuring apparatus
- Patent number 4,611,916
- Issue date Sep 16, 1986
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Optical device for optically recording and reproducing information...
- Patent number 4,507,766
- Issue date Mar 26, 1985
- Matsushita Electric Industrial Co., Ltd.
- Tetsuo Saimi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Shape measurement device probe and shape measurement device
- Publication number 20100011601
- Publication date Jan 21, 2010
- Takanori Funabashi
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
- Publication number 20090299692
- Publication date Dec 3, 2009
- Keiichi YOSHIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional measurement probe
- Publication number 20080148588
- Publication date Jun 26, 2008
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for quantitative quality inspection of substra...
- Publication number 20040090639
- Publication date May 13, 2004
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transferring a thin plate
- Publication number 20040037690
- Publication date Feb 26, 2004
- Matsushita Electric Industries Co., Ltd.
- Keishi Kubo
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Configuration measuring apparatus and method
- Publication number 20020196449
- Publication date Dec 26, 2002
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Profilometer and method for measuring, and method for manufacturing...
- Publication number 20020183964
- Publication date Dec 5, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Koji Handa
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring flatness of thin plate
- Publication number 20020167674
- Publication date Nov 14, 2002
- Keiichi Yoshizumi
- G01 - MEASURING TESTING

Keiichi Yoshizumi

Person

Patents Grantslast 30 patents

Shape measuring apparatus and shape measuring method

Shape measurement device probe and shape measurement device

Three-dimensional measurement probe

Measurement probe and using method for the same

Method and apparatus for transferring a thin plate

Method and apparatus for quantitative quality inspection of substra...

Configuration measuring apparatus and method

Profilometer and method for measuring, and method for manufacturing...

Apparatus and method for measuring flatness of thin plate

Method and apparatus for measuring thickness variation of a thin sh...

Shape measuring apparatus and method

Profile measuring apparatus

Configuration measuring method and apparatus for optically detectin...

Apparatus and method for measuring width of micro gap

Optical probe

Apparatus for measuring birefringence without employing rotating me...

Three-dimensional measuring apparatus

Error correcting method for measuring object surface using three-di...

Configuration measuring apparatus

Optical head apparatus for optical disc player

Optical measuring device

Optical information system having a birefringence plate movably dis...

Optical measuring apparatus

Optical device for optically recording and reproducing information...

Patents Applicationslast 30 patents

Shape measurement device probe and shape measurement device

SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD

Three-dimensional measurement probe

Method and apparatus for quantitative quality inspection of substra...

Method and apparatus for transferring a thin plate

Configuration measuring apparatus and method

Profilometer and method for measuring, and method for manufacturing...

Apparatus and method for measuring flatness of thin plate