Keiichiro Hitomi

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Kokubunji, JP

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Patents Grantslast 30 patents

Information Patent Grant
Standard component for calibration and electron-beam system using t...
- Patent number 7,875,850
- Issue date Jan 25, 2011
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and calibration of image distortion
- Patent number 7,750,296
- Issue date Jul 6, 2010
- Hitachi High-Technologies Corporation
- Keiichiro Hitomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam measurement equipment, size correction and st...
- Patent number 7,683,313
- Issue date Mar 23, 2010
- Hitachi High-Technologies Corporation
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Standard reference component for calibration, fabrication method fo...
- Patent number 7,612,334
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Standard component for calibration and electron-beam system using t...
- Publication number 20080251868
- Publication date Oct 16, 2008
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope and Calibration of Image Distortion
- Publication number 20080210867
- Publication date Sep 4, 2008
- Keiichiro Hitomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam measurement equipment, size correction and st...
- Publication number 20080203285
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Yasunari Sohda
- B82 - NANO-TECHNOLOGY
Information Patent Application
STANDARD REFERENCE COMPONENT FOR CALIBRATION, FABRICATION METHOD FO...
- Publication number 20080121791
- Publication date May 29, 2008
- Yoshinori Nakayama
- H01 - BASIC ELECTRIC ELEMENTS