Keiichiro Hitomi

Follow

Person

Delmar, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern dimension measurement method and charged particle beam micr...
- Patent number 9,200,896
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Keiichiro Hitomi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 9,110,384
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Seiko Omori
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning electron microscope and inspection method using same
- Patent number 8,637,820
- Issue date Jan 28, 2014
- Hitachi High-Technologies Corporation
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged beam device
- Patent number 8,478,021
- Issue date Jul 2, 2013
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- G01 - MEASURING TESTING
Information Patent Grant
Standard member for correction, scanning electron microscope using...
- Patent number 8,263,929
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120298865
- Publication date Nov 29, 2012
- Seiko Omori
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND INSPECTION METHOD USING SAME
- Publication number 20120286158
- Publication date Nov 15, 2012
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN DIMENSION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM MICR...
- Publication number 20120212602
- Publication date Aug 23, 2012
- Keiichiro Hitomi
- G01 - MEASURING TESTING
Information Patent Application
CHARGED BEAM DEVICE
- Publication number 20110274341
- Publication date Nov 10, 2011
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD OF PATTERN DIMENSION AND SCANNING ELECTRON MICROSC...
- Publication number 20110208477
- Publication date Aug 25, 2011
- Keiichiro Hitomi
- G01 - MEASURING TESTING
Information Patent Application
Standard Member for Correction, Scanning Electron Microscope Using...
- Publication number 20110133065
- Publication date Jun 9, 2011
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- B82 - NANO-TECHNOLOGY