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Keiichiro Mori
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of evaluating silicon wafer, method of evaluating silicon wa...
Patent number
11,948,819
Issue date
Apr 2, 2024
Sumco Corporation
Keiichiro Mori
B24 - GRINDING POLISHING
Information
Patent Grant
Method of preparing sample surface, method of analyzing sample surf...
Patent number
10,895,538
Issue date
Jan 19, 2021
Sumco Corporation
Keiichiro Mori
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer
Patent number
10,718,720
Issue date
Jul 21, 2020
Sumco Corporation
Keiichiro Mori
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer
Patent number
10,422,756
Issue date
Sep 24, 2019
Sumco Corporation
Keiichiro Mori
G02 - OPTICS
Information
Patent Grant
Method of evaluating epitaxial wafer
Patent number
9,633,913
Issue date
Apr 25, 2017
Sumco Corporation
Keiichiro Mori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cleaning method
Patent number
9,553,004
Issue date
Jan 24, 2017
Sumco Corporation
Makoto Takemura
B08 - CLEANING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF EVALUATING SEMICONDUCTOR WAFER
Publication number
20230194438
Publication date
Jun 22, 2023
SUMCO CORPORATION
Motoi KUROKAMI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CALIBRATING COORDINATE POSITION IDENTIFICATION ACCURACY O...
Publication number
20220373478
Publication date
Nov 24, 2022
SUMCO CORPORATION
Keiichiro MORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD AND SEMICONDUCTOR WAFER
Publication number
20190331609
Publication date
Oct 31, 2019
SUMCO CORPORATION, Tokyo, JAPAN
Keiichiro MORI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EVALUATING SILICON WAFER, METHOD OF EVALUATING SILICON WA...
Publication number
20190279890
Publication date
Sep 12, 2019
SUMCO CORPORATION
Keiichiro MORI
B24 - GRINDING POLISHING
Information
Patent Application
METHOD OF PREPARING SAMPLE SURFACE, METHOD OF ANALYZING SAMPLE SURF...
Publication number
20190128824
Publication date
May 2, 2019
SUMCO CORPORATION
Keiichiro MORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD AND SEMICONDUCTOR WAFER
Publication number
20180292330
Publication date
Oct 11, 2018
SUMCO CORPORATION
Keiichiro MORI
G02 - OPTICS
Information
Patent Application
METHOD OF EVALUATING EPITAXIAL WAFER
Publication number
20160307810
Publication date
Oct 20, 2016
SUMCO CORPORATION
Keiichiro MORI
G01 - MEASURING TESTING
Information
Patent Application
CLEANING METHOD
Publication number
20120234358
Publication date
Sep 20, 2012
SUMCO CORPORATION
Makoto Takemura
H01 - BASIC ELECTRIC ELEMENTS