Keiji Isamoto

Follow

Person

Aichi, JP

People

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNES...
- Publication number 20230349688
- Publication date Nov 2, 2023
- SANTEC CORPORATION
- Hiroyuki ITOH
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM
- Publication number 20200081319
- Publication date Mar 12, 2020
- SANTEC CORPORATION
- Kouki Totsuka
- G02 - OPTICS