Keiji Matsui

Person

Niwa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical encoder diffraction gratings for eliminating diffracted lig...
- Patent number 5,801,378
- Issue date Sep 1, 1998
- Okuma Corporation
- Kazuhiro Hane
- G01 - MEASURING TESTING
Information Patent Grant
Position detector
- Patent number 5,260,769
- Issue date Nov 9, 1993
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Optical position-detecting apparatus
- Patent number 5,249,032
- Issue date Sep 28, 1993
- Okuma Corporation
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Position detecting apparatus generating periodic detection signals...
- Patent number 5,182,613
- Issue date Jan 26, 1993
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Parallel light ray measuring apparatus
- Patent number 5,170,221
- Issue date Dec 8, 1992
- Okuma Corp.
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder
- Patent number 5,068,530
- Issue date Nov 26, 1991
- Kabushiki Kaisha Okuma Tekkosho
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Optical linear encoder with light quantity calabration
- Patent number 5,066,129
- Issue date Nov 19, 1991
- Kabushiki Kaisha Okuma Tekkosho
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Linear encoder with plural detectors for use with one or more main...
- Patent number 4,983,900
- Issue date Jan 8, 1991
- Kabushiki Kaisha Okuma Tekkosho
- Masayuki Nashiki
- G01 - MEASURING TESTING
Information Patent Grant
Optical linear encoder
- Patent number 4,979,827
- Issue date Dec 25, 1990
- Kabushiki Kaisha Okuma Tekkosho
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder with varying grating pitch
- Patent number 4,956,553
- Issue date Sep 11, 1990
- Kabushiki Kaisha Okuma Tekkosho
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
High resolution optical encoder having a long detection stroke
- Patent number 4,950,891
- Issue date Aug 21, 1990
- Kabushiki Kaisha Okuma Tekkosho
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
High resolution optical encoder having a long detection stroke
- Patent number 4,948,968
- Issue date Aug 14, 1990
- Spectra, Inc.
- Keiji Matsui
- G01 - MEASURING TESTING

Keiji Matsui

Person

Patents Grantslast 30 patents

Optical encoder diffraction gratings for eliminating diffracted lig...

Position detector

Optical position-detecting apparatus

Position detecting apparatus generating periodic detection signals...

Parallel light ray measuring apparatus

Optical encoder

Optical linear encoder with light quantity calabration

Linear encoder with plural detectors for use with one or more main...

Optical linear encoder

Optical encoder with varying grating pitch

High resolution optical encoder having a long detection stroke

High resolution optical encoder having a long detection stroke