Keiki Watanabe

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Adaptive equalizer
- Patent number 9,667,454
- Issue date May 30, 2017
- Hitachi, Ltd.
- Hideki Koba
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and communication device
- Patent number 8,963,637
- Issue date Feb 24, 2015
- Hitachi, Ltd.
- Hideki Koba
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Interface circuit, LSI, server device, and method of training the i...
- Patent number 8,441,300
- Issue date May 14, 2013
- Hitachi, Ltd.
- Keiki Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor integrated circuit having a self-testing function
- Patent number 6,871,311
- Issue date Mar 22, 2005
- Hitachi, Ltd.
- Keiki Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADAPTIVE EQUALIZER
- Publication number 20170180162
- Publication date Jun 22, 2017
- Hitachi, Ltd
- Hideki KOBA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTERFACE CIRCUIT, LSI, SERVER DEVICE, AND METHOD OF TRAINING THE I...
- Publication number 20110181335
- Publication date Jul 28, 2011
- Hitachi, Ltd.
- KEIKI WATANABE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR SYSTEM
- Publication number 20090080584
- Publication date Mar 26, 2009
- Hitachi, Ltd.
- Daisuke HAMANO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor integrated circuit having a self-testing function
- Publication number 20020040459
- Publication date Apr 4, 2002
- Keiki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Clock producing circuit and semiconductor integrated circuit for co...
- Publication number 20020031148
- Publication date Mar 14, 2002
- Keiki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit having receiving and transmitting...
- Publication number 20020021468
- Publication date Feb 21, 2002
- Takahiro Kato
- G01 - MEASURING TESTING