Keiko Kaneda

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus
- Patent number 11,090,694
- Issue date Aug 17, 2021
- TOSHIBA MEMORY CORPORATION
- Tomoko Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and having opposite surfaces with different directions a...
- Patent number 9,933,478
- Issue date Apr 3, 2018
- TOSHIBA MEMORY CORPORATION
- Tomoko Fujiwara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE-VARIABLE TYPE MEMORY ELEMENT AND SEMICONDUCTOR MEMORY DEVIC...
- Publication number 20200295038
- Publication date Sep 17, 2020
- Toshiba Memory Corporation
- Takao SUEYAMA
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING APPARATUS
- Publication number 20200030856
- Publication date Jan 30, 2020
- Toshiba Memory Corporation
- Tomoko FUJIWARA
- B08 - CLEANING
Information Patent Application
PROBE CARD AND TEST APPARATUS
- Publication number 20160291055
- Publication date Oct 6, 2016
- KABUSHIKI KAISHA TOSHIBA
- Tomoko FUJIWARA
- G01 - MEASURING TESTING