Keiko MORISHITA

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method and photomask fabrication method
- Patent number 11,579,537
- Issue date Feb 14, 2023
- Kioxia Corporation
- Keiko Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction pattern generation device, pattern defect correction sys...
- Patent number 11,187,975
- Issue date Nov 30, 2021
- TOSHIBA MEMORY CORPORATION
- Keiko Morishita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask and manufacturing method of mask
- Patent number 10,274,821
- Issue date Apr 30, 2019
- TOSHIBA MEMORY CORPORATION
- Keiko Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern formation method, control device, and semiconductor device...
- Patent number 10,241,394
- Issue date Mar 26, 2019
- TOSHIBA MEMORY CORPORATION
- Keiko Morishita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern evaluation method
- Patent number 7,947,413
- Issue date May 24, 2011
- Kabushiki Kaisha Toshiba
- Keiko Morishita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION METHOD AND PHOTOMASK FABRICATION METHOD
- Publication number 20210294225
- Publication date Sep 23, 2021
- KIOXIA Corporation
- Keiko MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRECTION PATTERN GENERATION DEVICE, PATTERN DEFECT CORRECTION SYS...
- Publication number 20200089103
- Publication date Mar 19, 2020
- Toshiba Memory Corporation
- Keiko Morishita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK AND MANUFACTURING METHOD OF MASK
- Publication number 20170269471
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Keiko MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN FORMATION METHOD, CONTROL DEVICE, AND SEMICONDUCTOR DEVICE...
- Publication number 20160259240
- Publication date Sep 8, 2016
- Kabushiki Kaisha Toshiba
- Keiko MORISHITA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern Evaluation Method
- Publication number 20090098472
- Publication date Apr 16, 2009
- Keiko MORISHITA
- G01 - MEASURING TESTING