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Keiko NAKANO
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Yokohama, JP
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Patents Grants
last 30 patents
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Patent Grant
Water quality assessment sensor, water quality assessment method fo...
Patent number
8,522,605
Issue date
Sep 3, 2013
Hitachi, Ltd.
Keiko Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Liquid crystal display device having common electrodes formed over...
Patent number
7,868,959
Issue date
Jan 11, 2011
Hitachi Displays, Ltd.
Keiko Nakano
G02 - OPTICS
Information
Patent Grant
Method of manufacturing liquid crystal display and drying apparatus
Patent number
6,900,875
Issue date
May 31, 2005
Hitachi, Ltd.
Keiko Nakano
G02 - OPTICS
Information
Patent Grant
Frictionally sliding head magnet disk apparatus
Patent number
5,825,591
Issue date
Oct 20, 1998
Hitachi, Ltd.
Takao Nakamura
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Water Quality Assessment Sensor, Water Quality Assessment Method fo...
Publication number
20100319441
Publication date
Dec 23, 2010
Hitachi, Ltd
Keiko NAKANO
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CRYSTAL DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20080212009
Publication date
Sep 4, 2008
Keiko Nakano
G02 - OPTICS
Information
Patent Application
Method of manufacturing liquid crystal display and drying apparatus
Publication number
20030112407
Publication date
Jun 19, 2003
Keiko Nakano
G02 - OPTICS