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Keiko Nogawa

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzing apparatus
    • Patent number 7,939,020
    • Issue date May 10, 2011
    • Hitachi High-Technologies Corporation
    • Keiko Nogawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing apparatus
    • Patent number 7,300,628
    • Issue date Nov 27, 2007
    • Hitachi High-Technologies Corporation
    • Keiko Nogawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic analyzing apparatus
    • Publication number 20070202011
    • Publication date Aug 30, 2007
    • Hitachi High-Technologies Corporation
    • Keiko Nogawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzing apparatus
    • Publication number 20030235514
    • Publication date Dec 25, 2003
    • Keiko Nogawa
    • G01 - MEASURING TESTING