Keiko Oka

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical condition determination system and optical condition determ...
- Patent number 11,378,521
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Hiroaki Kasai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,143,598
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,830,706
- Issue date Nov 10, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
DUV-UV band spectroscopic optical system and spectrometer using same
- Patent number 8,730,471
- Issue date May 20, 2014
- Hitachi, Ltd.
- Keiko Oka
- G11 - INFORMATION STORAGE
Information Patent Grant
Wavefront aberration measuring method and device therefor
- Patent number 8,705,024
- Issue date Apr 22, 2014
- Hitachi, Ltd.
- Yasuhiro Yoshitake
- G01 - MEASURING TESTING
Information Patent Grant
Grism
- Patent number 6,927,914
- Issue date Aug 9, 2005
- Riken
- Noboru Ebizuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Refrigerant Quantity Diagnosis Device, Refrigerant System, and Refr...
- Publication number 20230304713
- Publication date Sep 28, 2023
- HITACHI GLOBAL LIFE SOLUTIONS, INC.
- Yoko KOKUGAN
- B60 - VEHICLES IN GENERAL
Information Patent Application
OPTICAL CONDITION DETERMINATION SYSTEM AND OPTICAL CONDITION DETERM...
- Publication number 20210072162
- Publication date Mar 11, 2021
- Hitachi, Ltd
- Hiroaki Kasai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20210025829
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20200256804
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT ABERRATION MEASURING METHOD AND DEVICE THEREFOR
- Publication number 20120019813
- Publication date Jan 26, 2012
- HITACHI, LTD.
- Yasuhiro Yoshitake
- G01 - MEASURING TESTING
Information Patent Application
DUV-UV BAND SPECTROSCOPIC OPTICAL SYSTEM AND SPECTROMETER USING SAME
- Publication number 20110279820
- Publication date Nov 17, 2011
- Keiko Oka
- G02 - OPTICS
Information Patent Application
MATERIAL FOR CELL CULTURE
- Publication number 20110027890
- Publication date Feb 3, 2011
- KURARAY CO., LTD.
- Akio Fujita
- G01 - MEASURING TESTING
Information Patent Application
Grism
- Publication number 20040070853
- Publication date Apr 15, 2004
- Noboru Ebizuka
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Optical condition determination system and optical condition determ...

Defect inspection apparatus and defect inspection method

Defect inspection apparatus and defect inspection method

DUV-UV band spectroscopic optical system and spectrometer using same

Wavefront aberration measuring method and device therefor

Grism

Patents Applicationslast 30 patents

Refrigerant Quantity Diagnosis Device, Refrigerant System, and Refr...

OPTICAL CONDITION DETERMINATION SYSTEM AND OPTICAL CONDITION DETERM...

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

WAVEFRONT ABERRATION MEASURING METHOD AND DEVICE THEREFOR

DUV-UV BAND SPECTROSCOPIC OPTICAL SYSTEM AND SPECTROMETER USING SAME

MATERIAL FOR CELL CULTURE

Grism