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Keiko Yoshikawa

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,000,849
    • Issue date Jun 4, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,209,448
    • Issue date Dec 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,788,479
    • Issue date Sep 29, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,520,522
    • Issue date Dec 31, 2019
    • Hitachi High-Technologies Corporation
    • Keiko Yoshikawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,416,179
    • Issue date Sep 17, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Clinical analyzer
    • Patent number D849264
    • Issue date May 21, 2019
    • Hitachi High-Technologies Corporation
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,846,171
    • Issue date Dec 19, 2017
    • Hitachi High-Technologies Corporation
    • Keiko Yoshikawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,835,612
    • Issue date Dec 5, 2017
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,696,329
    • Issue date Jul 4, 2017
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 9,506,940
    • Issue date Nov 29, 2016
    • Hitachi High-Technologies Corporation
    • Keiko Yoshikawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20240272186
    • Publication date Aug 15, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER, WORK SUPPORT DEVICE, AND AUTOMATIC ANALYSIS SYSTEM
    • Publication number 20230314458
    • Publication date Oct 5, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Keiko YOSHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220074959
    • Publication date Mar 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190346470
    • Publication date Nov 14, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20180100871
    • Publication date Apr 12, 2018
    • HITACHI HIGH-TECHNOLOGIES COPRORATION
    • Keiko YOSHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180074043
    • Publication date Mar 15, 2018
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170269113
    • Publication date Sep 21, 2017
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150316532
    • Publication date Nov 5, 2015
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20150316570
    • Publication date Nov 5, 2015
    • Hitachi High-Technologies Corporation
    • Keiko Yoshikawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20150147230
    • Publication date May 28, 2015
    • Hitachi High-Technologies Corporation
    • Keiko Yoshikawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150104351
    • Publication date Apr 16, 2015
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS
    • Publication number 20130243657
    • Publication date Sep 19, 2013
    • Keiko Yoshikawa
    • G01 - MEASURING TESTING