Keiko YOSHIMIZU

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device using catadioptric objective lens
- Patent number 8,553,216
- Issue date Oct 8, 2013
- Hitachi, Ltd.
- Keiko Yoshimizu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE USING CATADIOPTRIC OBJECTIVE LENS
- Publication number 20120281207
- Publication date Nov 8, 2012
- Keiko Yoshimizu
- G02 - OPTICS
Information Patent Application
Adjustable Beam Size Illumination Optical Apparatus and Beam Size A...
- Publication number 20110228537
- Publication date Sep 22, 2011
- HITACHI VIA MECHANICS, LTD.
- Keiko YOSHIMIZU
- G02 - OPTICS