Keishi Kubo

Person

Moriguchi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement probe
- Patent number 11,473,904
- Issue date Oct 18, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 9,080,846
- Issue date Jul 14, 2015
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement probe
- Patent number 7,520,067
- Issue date Apr 21, 2009
- Panasonic Corporation
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and method for thin board
- Patent number 7,178,393
- Issue date Feb 20, 2007
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and using method for the same
- Patent number 7,065,893
- Issue date Jun 27, 2006
- Matsushita Electric Industrial Co., Ltd.
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transferring a thin plate
- Patent number 7,029,224
- Issue date Apr 18, 2006
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for quantitative quality inspection of substra...
- Patent number 7,012,680
- Issue date Mar 14, 2006
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring apparatus and method
- Patent number 6,934,036
- Issue date Aug 23, 2005
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Profilometer and method for measuring, and method for manufacturing...
- Patent number 6,763,319
- Issue date Jul 13, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Handa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring flatness of thin plate
- Patent number 6,710,883
- Issue date Mar 23, 2004
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thickness variation of a thin sh...
- Patent number 6,480,286
- Issue date Nov 12, 2002
- Matsushita Electric Inudstrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and method
- Patent number 6,026,583
- Issue date Feb 22, 2000
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Profile measuring apparatus
- Patent number 5,917,181
- Issue date Jun 29, 1999
- Marsushita Electric Industrial, Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring method and apparatus for optically detectin...
- Patent number 5,616,916
- Issue date Apr 1, 1997
- Matsushita Electric Industrial Co., Ltd.
- Koji Handa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for measuring width of micro gap
- Patent number 5,459,939
- Issue date Oct 24, 1995
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe
- Patent number 5,455,677
- Issue date Oct 3, 1995
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Alignment apparatus for use in exposure system for optically transf...
- Patent number 5,329,354
- Issue date Jul 12, 1994
- Matsushita Electric Industrial Co., Ltd.
- Masaki Yamamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for measuring birefringence without employing rotating me...
- Patent number 5,319,194
- Issue date Jun 7, 1994
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a minute displacement
- Patent number 5,315,373
- Issue date May 24, 1994
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Minute displacement detector using optical interferometry
- Patent number 5,164,791
- Issue date Nov 17, 1992
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Configuration measuring apparatus
- Patent number 5,144,150
- Issue date Sep 1, 1992
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Velocity detector for detecting velocity from position detector out...
- Patent number 5,012,188
- Issue date Apr 30, 1991
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical wavelength convertical apparatus
- Patent number 5,005,938
- Issue date Apr 9, 1991
- Matsushita Electric Industry Co., Ltd.
- Tatsuo Itoh
- G02 - OPTICS
Information Patent Grant
Position transducer having absolute position compensation
- Patent number 4,970,387
- Issue date Nov 13, 1990
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STORAGE DEVICE AND STORAGE METHOD FOR MEASUREMENT PROBE
- Publication number 20240426589
- Publication date Dec 26, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- TOSHIO SHIBUTANI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MEASUREMENT PROBE
- Publication number 20210123725
- Publication date Apr 29, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- KEISHI KUBO
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS
- Publication number 20140068958
- Publication date Mar 13, 2014
- PANASONIC CORPORATION
- Keishi KUBO
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional measurement probe
- Publication number 20080148588
- Publication date Jun 26, 2008
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Application
Measuring apparatus and method for thin board
- Publication number 20050223791
- Publication date Oct 13, 2005
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Measurement probe and using method for the same
- Publication number 20050204573
- Publication date Sep 22, 2005
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for quantitative quality inspection of substra...
- Publication number 20040090639
- Publication date May 13, 2004
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transferring a thin plate
- Publication number 20040037690
- Publication date Feb 26, 2004
- Matsushita Electric Industries Co., Ltd.
- Keishi Kubo
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Configuration measuring apparatus and method
- Publication number 20020196449
- Publication date Dec 26, 2002
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Profilometer and method for measuring, and method for manufacturing...
- Publication number 20020183964
- Publication date Dec 5, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Koji Handa
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring flatness of thin plate
- Publication number 20020167674
- Publication date Nov 14, 2002
- Keiichi Yoshizumi
- G01 - MEASURING TESTING

Keishi Kubo

Person

Patents Grantslast 30 patents

Measurement probe

Shape measuring apparatus

Three-dimensional measurement probe

Measuring apparatus and method for thin board

Measurement probe and using method for the same

Method and apparatus for transferring a thin plate

Method and apparatus for quantitative quality inspection of substra...

Configuration measuring apparatus and method

Profilometer and method for measuring, and method for manufacturing...

Apparatus and method for measuring flatness of thin plate

Method and apparatus for measuring thickness variation of a thin sh...

Shape measuring apparatus and method

Profile measuring apparatus

Configuration measuring method and apparatus for optically detectin...

Apparatus and method for measuring width of micro gap

Optical probe

Alignment apparatus for use in exposure system for optically transf...

Apparatus for measuring birefringence without employing rotating me...

Method of measuring a minute displacement

Minute displacement detector using optical interferometry

Configuration measuring apparatus

Velocity detector for detecting velocity from position detector out...

Optical wavelength convertical apparatus

Position transducer having absolute position compensation

Patents Applicationslast 30 patents

STORAGE DEVICE AND STORAGE METHOD FOR MEASUREMENT PROBE

MEASUREMENT PROBE

SHAPE MEASURING APPARATUS

Three-dimensional measurement probe

Measuring apparatus and method for thin board

Measurement probe and using method for the same

Method and apparatus for quantitative quality inspection of substra...

Method and apparatus for transferring a thin plate

Configuration measuring apparatus and method

Profilometer and method for measuring, and method for manufacturing...

Apparatus and method for measuring flatness of thin plate