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Keishi Oohashi
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electric field/magnetic field sensors and methods of fabricating th...
Patent number
8,519,323
Issue date
Aug 27, 2013
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Grant
Electric field sensor and method for fabricating the same
Patent number
8,153,955
Issue date
Apr 10, 2012
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating photodiodes
Patent number
7,883,911
Issue date
Feb 8, 2011
NEC Corporation
Keishi Oohashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodiode and method for fabricating same
Patent number
7,728,366
Issue date
Jun 1, 2010
NEC Corporation
Keishi Oohashi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ELECTRIC FIELD/MAGNETIC FIELD SENSORS AND METHODS OF FABRICATING TH...
Publication number
20120164321
Publication date
Jun 28, 2012
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC FIELD/MAGNETIC FIELD SENSORS AND METHODS OF FABRICATING TH...
Publication number
20090224753
Publication date
Sep 10, 2009
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Application
PHOTODIODE AND METHOD FOR FABRICATING SAME
Publication number
20090176327
Publication date
Jul 9, 2009
Keishi Oohashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Photodiode and method for fabricating same
Publication number
20070194357
Publication date
Aug 23, 2007
Keishi Oohashi
H01 - BASIC ELECTRIC ELEMENTS