Keisuke Goto

Person

Obu-city, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Used secondary battery module management system server, used second...
- Patent number 11,561,260
- Issue date Jan 24, 2023
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Method for positioning dicing line of wafer
- Patent number 7,763,525
- Issue date Jul 27, 2010
- Denso Corporation
- Keisuke Goto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitive physical quantity sensor and method of diagnosing the same
- Patent number 7,432,724
- Issue date Oct 7, 2008
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance type physical quantity sensor having sensor chip and ci...
- Patent number 7,272,974
- Issue date Sep 25, 2007
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor having sensor chip and circuit chip
- Patent number 7,263,885
- Issue date Sep 4, 2007
- Denso Corporation
- Keisuke Goto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of inspecting a semiconductor dynamic quantity sensor
- Patent number 7,046,028
- Issue date May 16, 2006
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Foreign material removing method for capacitance type dynamic quant...
- Patent number 7,045,371
- Issue date May 16, 2006
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive dynamic quantity sensor device
- Patent number 6,935,176
- Issue date Aug 30, 2005
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance type dynamic quantity sensor device
- Patent number 6,876,093
- Issue date Apr 5, 2005
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive dynamic quantity sensor, method for manufacturing capaci...
- Patent number 6,848,310
- Issue date Feb 1, 2005
- Denso Corporation
- Keisuke Goto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VEHICLE BATTERY ASSESSMENT SYSTEM
- Publication number 20250067812
- Publication date Feb 27, 2025
- DENSO CORPORATION
- Tomomi ASAI
- B60 - VEHICLES IN GENERAL
Information Patent Application
USED SECONDARY BATTERY MODULE MANAGEMENT SYSTEM SERVER, USED SECOND...
- Publication number 20220229120
- Publication date Jul 21, 2022
- DENSO CORPORATION
- Keisuke GOTO
- G01 - MEASURING TESTING
Information Patent Application
Capacitive physical quantity sensor and method of diagnosing the same
- Publication number 20070126432
- Publication date Jun 7, 2007
- DENSO CORPORATION
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Capacitance type physical quantity sensor having sensor chip and ci...
- Publication number 20060065053
- Publication date Mar 30, 2006
- DENSO Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Method for positioning dicing line of wafer
- Publication number 20060024920
- Publication date Feb 2, 2006
- DENSO Corporation
- Keisuke Goto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical quantity sensor having sensor chip and circuit chip
- Publication number 20050178203
- Publication date Aug 18, 2005
- DENSO Corporation
- Keisuke Goto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method of inspecting a semiconductor dynamic quantity sensor
- Publication number 20050179440
- Publication date Aug 18, 2005
- DENSO Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Foreign material removing method for capacitance type dynamic quant...
- Publication number 20050059239
- Publication date Mar 17, 2005
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE TYPE DYNAMIC QUANTITY SENSOR DEVICE
- Publication number 20050051910
- Publication date Mar 10, 2005
- DENSO Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Capacitive dynamic quantity sensor device
- Publication number 20040226376
- Publication date Nov 18, 2004
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Capacitive-type semiconductor sensor
- Publication number 20040187571
- Publication date Sep 30, 2004
- DENSO Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Capacitive-type semiconductor sensor having shared conductive pads...
- Publication number 20040182156
- Publication date Sep 23, 2004
- DENSO Corporation
- Keisuke Goto
- G01 - MEASURING TESTING
Information Patent Application
Capacitive dynamic quantity sensor, method for manufacturing capaci...
- Publication number 20040017209
- Publication date Jan 29, 2004
- Keisuke Goto
- G01 - MEASURING TESTING

Keisuke Goto

Person

Patents Grantslast 30 patents

Used secondary battery module management system server, used second...

Method for positioning dicing line of wafer

Capacitive physical quantity sensor and method of diagnosing the same

Capacitance type physical quantity sensor having sensor chip and ci...

Physical quantity sensor having sensor chip and circuit chip

Method of inspecting a semiconductor dynamic quantity sensor

Foreign material removing method for capacitance type dynamic quant...

Capacitive dynamic quantity sensor device

Capacitance type dynamic quantity sensor device

Capacitive dynamic quantity sensor, method for manufacturing capaci...

Patents Applicationslast 30 patents

VEHICLE BATTERY ASSESSMENT SYSTEM

USED SECONDARY BATTERY MODULE MANAGEMENT SYSTEM SERVER, USED SECOND...

Capacitive physical quantity sensor and method of diagnosing the same

Capacitance type physical quantity sensor having sensor chip and ci...

Method for positioning dicing line of wafer

Physical quantity sensor having sensor chip and circuit chip

Method of inspecting a semiconductor dynamic quantity sensor

Foreign material removing method for capacitance type dynamic quant...

CAPACITANCE TYPE DYNAMIC QUANTITY SENSOR DEVICE

Capacitive dynamic quantity sensor device

Capacitive-type semiconductor sensor

Capacitive-type semiconductor sensor having shared conductive pads...

Capacitive dynamic quantity sensor, method for manufacturing capaci...