Keisuke Igarashi

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and focus adjusting method therefor
- Patent number 12,368,017
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Keisuke Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sensor, ion concentration measurement method, and electronic co...
- Patent number 10,845,323
- Issue date Nov 24, 2020
- Waseda University
- Hiroshi Kawarada
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced article management system and method
- Patent number 6,595,418
- Issue date Jul 22, 2003
- Hitachi Kokusai Electric Inc.
- Keisuke Igarashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Focus Adjusting Method Therefor
- Publication number 20230230798
- Publication date Jul 20, 2023
- Hitachi High-Tech Corporation
- Keisuke IGARASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Inspection Method Using Transm...
- Publication number 20220244201
- Publication date Aug 4, 2022
- Hitachi High-Tech Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SENSOR, ION CONCENTRATION MEASUREMENT METHOD, AND ELECTRONIC CO...
- Publication number 20190049401
- Publication date Feb 14, 2019
- Waseda University
- Hiroshi Kawarada
- G01 - MEASURING TESTING