Keisuke KUWANO

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen processing apparatus, specimen measurement system and meth...
- Patent number 12,076,724
- Issue date Sep 3, 2024
- Sysmex Corporation
- Kazuhiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis system and sample analyzer
- Patent number 9,829,497
- Issue date Nov 28, 2017
- Sysmex Corporation
- Hiroo Tatsutani
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analysis system, specimen analyzer, and specimen analysis...
- Patent number 9,618,363
- Issue date Apr 11, 2017
- Sysmex Corporation
- Tetsuya Oda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Sample processing apparatus and sample processing method
- Patent number 9,134,333
- Issue date Sep 15, 2015
- Sysmex Corporation
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 8,945,470
- Issue date Feb 3, 2015
- SYSMEX CORPORATION
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample processing apparatus
- Patent number 8,936,752
- Issue date Jan 20, 2015
- Sysmex Corporation
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and a method of controlling a sample pr...
- Patent number 8,889,069
- Issue date Nov 18, 2014
- Sysmex Corporation
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzing system, sample analyzer and management apparatus
- Patent number 8,868,370
- Issue date Oct 21, 2014
- Sysmex Corporation
- Naoki Shindo
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and method of notifying user by the same
- Patent number 8,852,506
- Issue date Oct 7, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and method for controling a sample analyzer
- Patent number 8,845,964
- Issue date Sep 30, 2014
- Sysmex Corporation
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing system, base for sample processing system, and sa...
- Patent number 8,741,219
- Issue date Jun 3, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample transporting method
- Patent number 8,728,396
- Issue date May 20, 2014
- Sysmex Corporation
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus
- Patent number 8,706,303
- Issue date Apr 22, 2014
- Sysmex Corporation
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing system, sample processing method, and computer pr...
- Patent number 8,594,836
- Issue date Nov 26, 2013
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN PROCESSING APPARATUS, SPECIMEN MEASUREMENT SYSTEM AND METH...
- Publication number 20210053050
- Publication date Feb 25, 2021
- SYSMEX CORPORATION
- Kazuhiro YAMADA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYZER
- Publication number 20140037502
- Publication date Feb 6, 2014
- SYSMEX CORPORATION
- Hiroo TATSUTANI
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYSIS SYSTEM, SPECIMEN ANALYZER, AND SPECIMEN ANALYSIS...
- Publication number 20130317773
- Publication date Nov 28, 2013
- SYSMEX CORPORATION
- Tetsuya ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND METHOD FOR CONTROLING A SAMPLE ANALYZER
- Publication number 20130079921
- Publication date Mar 28, 2013
- SYSMEX CORPORATION
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND A METHOD OF CONTROLLING A SAMPLE PR...
- Publication number 20130079919
- Publication date Mar 28, 2013
- SYSMEX CORPORATION
- Daigo Fukuma
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS
- Publication number 20120282155
- Publication date Nov 8, 2012
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE PROCESSING APPARATUS
- Publication number 20120141326
- Publication date Jun 7, 2012
- SYSMEX CORPORATION
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZING SYSTEM, SAMPLE ANALYZER AND MANAGEMENT APPARATUS
- Publication number 20120078514
- Publication date Mar 29, 2012
- Naoki Shindo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE ANALYZER AND METHOD OF NOTIFYING USER BY THE SAME
- Publication number 20110244580
- Publication date Oct 6, 2011
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE TRANSPORTING METHOD
- Publication number 20110223580
- Publication date Sep 15, 2011
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD
- Publication number 20100248292
- Publication date Sep 30, 2010
- SYSMEX CORPORATION
- Keisuke KUWANO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
- Publication number 20100248293
- Publication date Sep 30, 2010
- SYSMEX CORPORATION
- Keisuke KUWANO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING SYSTEM, SAMPLE PROCESSING METHOD, AND COMPUTER PR...
- Publication number 20100152890
- Publication date Jun 17, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING SYSTEM, BASE FOR SAMPLE PROCESSING SYSTEM, AND SA...
- Publication number 20100150780
- Publication date Jun 17, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING

Keisuke KUWANO

Person

Patents Grantslast 30 patents

Specimen processing apparatus, specimen measurement system and meth...

Sample analysis system and sample analyzer

Specimen analysis system, specimen analyzer, and specimen analysis...

Sample processing apparatus and sample processing method

Sample analyzer and sample analyzing method

Sample analyzer and sample processing apparatus

Sample processing apparatus and a method of controlling a sample pr...

Sample analyzing system, sample analyzer and management apparatus

Sample analyzer and method of notifying user by the same

Sample analyzer and method for controling a sample analyzer

Sample processing system, base for sample processing system, and sa...

Sample analyzer and sample transporting method

Sample processing apparatus

Sample processing system, sample processing method, and computer pr...

Patents Applicationslast 30 patents

SPECIMEN PROCESSING APPARATUS, SPECIMEN MEASUREMENT SYSTEM AND METH...

SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYZER

SPECIMEN ANALYSIS SYSTEM, SPECIMEN ANALYZER, AND SPECIMEN ANALYSIS...

SAMPLE ANALYZER AND METHOD FOR CONTROLING A SAMPLE ANALYZER

SAMPLE PROCESSING APPARATUS AND A METHOD OF CONTROLLING A SAMPLE PR...

SAMPLE PROCESSING APPARATUS

SAMPLE ANALYZER AND SAMPLE PROCESSING APPARATUS

SAMPLE ANALYZING SYSTEM, SAMPLE ANALYZER AND MANAGEMENT APPARATUS

SAMPLE ANALYZER AND METHOD OF NOTIFYING USER BY THE SAME

SAMPLE ANALYZER AND SAMPLE TRANSPORTING METHOD

SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD

SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD

SAMPLE PROCESSING SYSTEM, SAMPLE PROCESSING METHOD, AND COMPUTER PR...

SAMPLE PROCESSING SYSTEM, BASE FOR SAMPLE PROCESSING SYSTEM, AND SA...