Keisuke MIZUUCHI

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam apparatus for inspecting a pattern on a sample using...
- Patent number 9,136,091
- Issue date Sep 15, 2015
- Ebara Corporation
- Toshifumi Kimba
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus for inspecting a pattern on a sample using...
- Patent number 8,639,463
- Issue date Jan 28, 2014
- Ebara Corporation
- Toshifumi Kimba
- G01 - MEASURING TESTING
Information Patent Grant
XY-coordinate compensation apparatus and method in sample pattern i...
- Patent number 8,280,664
- Issue date Oct 2, 2012
- Ebara Corporation
- Toshifumi Kimba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM APPARATUS FOR INSPECTING A PATTERN ON A SAMPLE USING...
- Publication number 20140107959
- Publication date Apr 17, 2014
- EBARA CORPORATION
- Toshifumi KIMBA
- G01 - MEASURING TESTING
Information Patent Application
XY-COORDINATE COMPENSATION APPARATUS AND METHOD IN SAMPLE PATTERN I...
- Publication number 20130056635
- Publication date Mar 7, 2013
- Toshifumi Kimba
- G01 - MEASURING TESTING
Information Patent Application
XY-COORDINATE COMPENSATION APPARATUS AND METHOD IN SAMPLE PATTERN I...
- Publication number 20100282956
- Publication date Nov 11, 2010
- Toshifumi Kimba
- G01 - MEASURING TESTING