Keita FUJINO

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning type probe microscope and control device for scanning type...
- Patent number 11,454,647
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and position adjustment method for scanni...
- Patent number 11,054,441
- Issue date Jul 6, 2021
- Shimadzu Corporation
- Keita Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 10,996,238
- Issue date May 4, 2021
- Shimadzu Corporation
- Keita Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,641,790
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...
- Publication number 20220358636
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...
- Publication number 20210311091
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Position Adjustment Method for Scanni...
- Publication number 20210102971
- Publication date Apr 8, 2021
- Shimadzu Corporation
- Keita FUJINO
- G01 - MEASURING TESTING
Information Patent Application
Surface Analyzer
- Publication number 20200319229
- Publication date Oct 8, 2020
- Shimadzu Corporation
- Keita FUJINO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190324053
- Publication date Oct 24, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING

Keita FUJINO

Person

Patents Grantslast 30 patents

Scanning type probe microscope and control device for scanning type...

Scanning probe microscope and position adjustment method for scanni...

Surface analyzer

Scanning probe microscope

Scanning probe microscope and light intensity adjusting method

Patents Applicationslast 30 patents

ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...

Scanning Probe Microscope and Position Adjustment Method for Scanni...

Surface Analyzer

SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD

SCANNING PROBE MICROSCOPE