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Keita Masuhara
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Atsugi-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring apparatus and measuring method
Patent number
10,277,339
Issue date
Apr 30, 2019
Anritsu Corporation
Keita Masuhara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement parameter input control device and measurement paramete...
Patent number
8,442,662
Issue date
May 14, 2013
Anritsu Corporation
Yohei Niki
G01 - MEASURING TESTING
Information
Patent Grant
Data signal quality evaluation apparatus
Patent number
8,391,346
Issue date
Mar 5, 2013
Anritsu Corporation
Keita Masuhara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical time domain reflectometer, and optical fiber measuring meth...
Patent number
7,620,513
Issue date
Nov 17, 2009
Anritsu Corporation
Norio Nakayama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASURING APPARATUS AND MEASURING METHOD
Publication number
20180269998
Publication date
Sep 20, 2018
Anritsu Corporation
Keita Masuhara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DATA SIGNAL QUALITY EVALUATION APPARATUS
Publication number
20110268170
Publication date
Nov 3, 2011
Anritsu Corporation
Keita Masuhara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MEASUREMENT PARAMETER INPUT CONTROL DEVICE AND MEASUREMENT PARAMETE...
Publication number
20110196515
Publication date
Aug 11, 2011
Anritsu Corporation
Yohei Niki
G01 - MEASURING TESTING
Information
Patent Application
WINDOW DISPLAY CONTROL APPARATUS AND METHOD OF CONTROLLING WINDOW D...
Publication number
20110119622
Publication date
May 19, 2011
Anritsu Corporation
Yohei Niki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Optical Time Domain Reflectometer, And Optical Fiber Measuring Meth...
Publication number
20080086278
Publication date
Apr 10, 2008
Anritsu Corporation
Norio Nakayama
G01 - MEASURING TESTING