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Keita Oikawa
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Nagoya-city, JP
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last 30 patents
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Patent Grant
Apparatus for inspecting defects of honeycomb structure
Patent number
8,174,689
Issue date
May 8, 2012
NGK Insulators, Ltd.
Takayoshi Akao
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
APPARATUS FOR INSPECTING DEFECTS OF HONEYCOMB STRUCTURE
Publication number
20090237652
Publication date
Sep 24, 2009
NGK Insulators, Ltd.
Takayoshi Akao
G01 - MEASURING TESTING