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Keitaro Harada

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  • Yamagata, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    IC test system
    • Patent number 10,527,669
    • Issue date Jan 7, 2020
    • HappyJapan, Inc.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC handler
    • Patent number 10,222,413
    • Issue date Mar 5, 2019
    • HappyJapan Inc.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Process for forming thin film and system for forming thin film
    • Patent number 9,260,780
    • Issue date Feb 16, 2016
    • Tohoku Seiki Industries, Ltd.
    • Masanobu Kusunoki
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Wire bobbin holder of bobbin cassette in wiring apparatus
    • Patent number 8,662,437
    • Issue date Mar 4, 2014
    • Tohoku Seiki Industries, Ltd.
    • Keitaro Harada
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Sputtering system
    • Patent number 8,597,479
    • Issue date Dec 3, 2013
    • Tohoku Seiki Industries, Ltd.
    • Keitaro Harada
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Device-positioning pedestal and handler having the device-positioni...
    • Patent number 8,093,853
    • Issue date Jan 10, 2012
    • Tohoku Seiki Industries, Ltd.
    • Keitaro Harada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC handler
    • Patent number 6,742,981
    • Issue date Jun 1, 2004
    • Tohoku Seiki Industries, Ltd.
    • Keitaro Harada
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    IC TEST SYSTEM
    • Publication number 20180267097
    • Publication date Sep 20, 2018
    • HAPPYJAPAN, INC.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC HANDLER
    • Publication number 20160370424
    • Publication date Dec 22, 2016
    • HAPPYJAPAN, INC.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC HANDLER
    • Publication number 20160356843
    • Publication date Dec 8, 2016
    • HAPPYJAPAN, INC.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR PRODUCING COMPOUND HAVING CHALCOPYRITE STRUCTURE
    • Publication number 20130280855
    • Publication date Oct 24, 2013
    • TOHOKU SEIKI INDUSTRIES, CO., LTD.
    • Koji Moriya
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    WIRE BOBBIN HOLDER OF BOBBIN CASSETTE IN WIRING APPARATUS
    • Publication number 20110049286
    • Publication date Mar 3, 2011
    • Tohoku Seiki Industries, Ltd.
    • Keitaro Harada
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    Device-Positioning Pedestal and Handler Having the Device-Positioni...
    • Publication number 20090206224
    • Publication date Aug 20, 2009
    • Keitaro Harada
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPUTTERING SYSTEM
    • Publication number 20090026073
    • Publication date Jan 29, 2009
    • Keitaro Harada
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    Process for Forming Thin Film and System for Forming Thin Film
    • Publication number 20080076269
    • Publication date Mar 27, 2008
    • Masanobu Kusunoki
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    Ic handler
    • Publication number 20030012633
    • Publication date Jan 16, 2003
    • Keitaro Harada
    • G01 - MEASURING TESTING